A Fourfold Coordinated Point Defect in Silicon

Physical Review Letters

Volumn 88, Issue 23, 2002, Pages 4-

  Goedecker, Stefan ^a   Deutsch, Thierry ^a   Billard, Luc ^a  

^a CEA GRENOBLE   (France)

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Indexed keywords

EID: 85038328351     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.88.235501     Document Type: Article

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