Analysis of Nonideal Effects on a Tomography-Based Switched-Capacitor Transducer

IEEE Sensors Journal

Volumn 7, Issue 3, 2007, Pages 381-391

  Chan, P K ^a,b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b Micro O2 ^*  (Singapore)

Author keywords

Capacitive interface; capacitive transducer; CMOS circuit; electrical capacitance tomography (ECT); switched capacitor circuit

Indexed keywords

EID: 85008066158     PISSN: 1530437X     EISSN: 15581748     Source Type: Journal    
DOI: 10.1109/JSEN.2006.890124     Document Type: Article

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