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Volumn 33, Issue 14, 1997, Pages 1211-1213

Capacitance tomography sensor without CMOS switches

Author keywords

Capacitance measurement; Tomography

Indexed keywords

CAPACITANCE MEASUREMENT; CMOS INTEGRATED CIRCUITS; ELECTRODES; OPTICAL SWITCHES;

EID: 0031551162     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19970808     Document Type: Article
Times cited : (5)

References (5)
  • 1
    • 0030193375 scopus 로고    scopus 로고
    • Charge injection compensation for charge/discharge capacitance measuring circuits used in tomography systems
    • YANG, W.Q.: 'Charge injection compensation for charge/discharge capacitance measuring circuits used in tomography systems', Meas. Sci. Technol., 1996, 7, (7), pp. 1073-1078
    • (1996) Meas. Sci. Technol. , vol.7 , Issue.7 , pp. 1073-1078
    • Yang, W.Q.1
  • 4
    • 0026817549 scopus 로고
    • Design of sensor electronics for electrical capacitance tomography
    • HUANG, S.M., XIE, C.G., THORN, R., SNOWDEN, D., and BECK, M.S.: 'Design of sensor electronics for electrical capacitance tomography', IEE Proc. G, 1992, 139, (1), pp. 83-88
    • (1992) IEE Proc. G , vol.139 , Issue.1 , pp. 83-88
    • Huang, S.M.1    Xie, C.G.2    Thorn, R.3    Snowden, D.4    Beck, M.S.5
  • 5
    • 0031140819 scopus 로고    scopus 로고
    • Sensitivity distributions of capacitance tomography sensors with parallel field excitation
    • in press
    • YANG, W.Q., SPINK, D.M., GAMIO, J.C., and BECK, M.S.: 'Sensitivity distributions of capacitance tomography sensors with parallel field excitation', Meas. Sci. Technol., 1997, (in press)
    • (1997) Meas. Sci. Technol.
    • Yang, W.Q.1    Spink, D.M.2    Gamio, J.C.3    Beck, M.S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.