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Volumn 33, Issue 14, 1997, Pages 1211-1213
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Capacitance tomography sensor without CMOS switches
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Author keywords
Capacitance measurement; Tomography
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Indexed keywords
CAPACITANCE MEASUREMENT;
CMOS INTEGRATED CIRCUITS;
ELECTRODES;
OPTICAL SWITCHES;
ELECTRICAL CAPACITANCE TOMOGRAPHY (ECT);
OPTICAL SENSORS;
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EID: 0031551162
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19970808 Document Type: Article |
Times cited : (5)
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References (5)
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