Circuit techniques for reducing the effects of Op-Amp imperfections: Autozeroing, correlated double sampling, and chopper stabilization

Proceedings of the IEEE

Volumn 84, Issue 11, 1996, Pages 1584-1614

  Enz, Christian C ^a   Temes, Gabor C ^b  

^a EPFL   (Switzerland)

^b Oregon State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHOPPERS (CIRCUITS); CMOS INTEGRATED CIRCUITS; DEFECTS; INTEGRATED CIRCUIT MANUFACTURE; LINEAR INTEGRATED CIRCUITS; OPERATIONAL AMPLIFIERS; SHOT NOISE; SIGNAL PROCESSING; THERMAL NOISE; TRANSISTORS;

AMPLIFIER GAIN; AUTOZEROING; CHOPPER STABILIZATION; CORRELATED DOUBLE SAMPLING; DATA ANALOG SIGNAL PROCESSING; DC OFFSET; LOW FREQUENCY NOISE; NARROW BAND NOISE; OPERATIONAL AMPLIFIER IMPERFECTIONS;

CIRCUIT THEORY;

EID: 0030286542     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/5.542410     Document Type: Article

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