Integrated electrodes for electrical capacitance tomography

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1998, Pages 472-475

  Williams, P M ^a   Haycock, R J ^a   York, T A ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; DATA COMMUNICATION SYSTEMS; DIGITAL COMMUNICATION SYSTEMS; FREQUENCIES; INTEGRATED CIRCUIT LAYOUT; TRANSDUCERS;

CHARGE DISCHARGE CIRCUITS; ELECTRICAL CAPACITANCE TOMOGRAPHY;

ELECTRODES;

EID: 0031650113     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)