A tomography based switched-capacitor measuring circuit with low offset and low temperature drift

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2004, Pages 1429-1432

  Peng, Jia ^a   Chan, P K ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b O2 Micro Pte Ltd   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CMOS INTEGRATED CIRCUITS; DATA ACQUISITION; LOW PASS FILTERS; MOS DEVICES; SPURIOUS SIGNAL NOISE; TOMOGRAPHY;

CORRELATED DOUBLE SAMPLING (CDS); ELECTRICAL CAPACITANCE TOMOGRAPHY (ECT); SIGNAL TRANSFER PHASE; TEMPERATURE DRIFT;

CAPACITANCE MEASUREMENT;

EID: 4644230238     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. S.M. Huang, C.G. Xie, R. Thorn, D. Snowden and M.S. Beck, "Design of sensor electronics for electrical capacitance tomography", IEE Proceeding-G, Vol. 139, No. 1, pp. 83-88, 1992.
2. P.M. Williams, R.J. Haycock and T.A. York, "Integrated Electrodes for Electrical Capacitance Tomography", IEEE Instrumentation and Measurement Technology Conference, May 1998.
3. H. Hahnel, W.Q. Yang, and T.A. York, "An ac-based capacitance measuring circuit for tomography systems and its silicon chip design", Advances in Sensors, IEE Colloquium, pp 6/1-6/8, Dec. 1995.
4. David A. Johns and K. Martin, "Analog Integrated Circuit Design", John Wiley & Sons, 1997.