Transient processes and noise in a tomography system: An analytical case study

IEEE Sensors Journal

Volumn 5, Issue 2, 2005, Pages 321-329

  Gonzalez Nakazawa, Alejandro ^a   Gamio, Jose Carlos ^b   Yang, Wuqiang ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b INSTITUTO MEXICANO DEL PETRÓLEO   (Mexico)

Author keywords

Capacitance tomography; Circuit analysis; Noise analysis; Optimization; Transient process analysis

Indexed keywords

CAPACITANCE; DATA ACQUISITION; ELECTRIC NETWORK ANALYSIS; ELECTRIC POTENTIAL; ELECTRODES; OPTIMIZATION; PERMITTIVITY; SENSORS; SPURIOUS SIGNAL NOISE;

CAPACITANCE TOMOGRAPHY; ELECTRICAL CAPACITANCE TOMOGRAPHY (ECT); NOISE ANALYSIS; TRANSIENT PROCESS ANALYSIS;

TOMOGRAPHY;

EID: 16444373738     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2004.842623     Document Type: Article

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