Analysis of the effect of stray capacitance on an AC-based capacitance tomography transducer

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 5, 2003, Pages 1674-1681

  Yang, W Q ^a   Stott, A L ^a   Gamio, J C ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b INSTITUTO MEXICANO DEL PETRÓLEO   (Mexico)

Author keywords

Capacitance measurement; Circuit analysis; Stray immune; Tomography

Indexed keywords

CAPACITANCE MEASUREMENT; CMOS INTEGRATED CIRCUITS; MEASUREMENT ERRORS; SWITCHING CIRCUITS; TOMOGRAPHY;

CAPACITANCE TOMOGRAPHY TRANSDUCER; ELECTRICAL CAPACITANCE TOMOGRAPHY; STRAY CAPACITANCE;

TRANSDUCERS;

EID: 0242468156     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.817925     Document Type: Article

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