-
1
-
-
0033878352
-
Comparison of the state-of-the-art high power IGBTs, GCTs and ETOs
-
K. Motto, Y. Li, and A. Q. Huang, “Comparison of the state-of-the-art high power IGBTs, GCTs and ETOs”, in Proc. IEEE Appl. Power Electron. Conf., 2000, vol. 2, pp. 1129–1136.
-
(2000)
Proc. IEEE Appl. Power Electron. Conf.
, vol.2
, pp. 1129-1136
-
-
Motto, K.1
Li, Y.2
Huang, A.Q.3
-
2
-
-
33646891147
-
Silicon carbide benefits and advantages for power electronics circuits and systems
-
Jun.
-
A. Elasser and T. P. Chow, “Silicon carbide benefits and advantages for power electronics circuits and systems”, Proc. IEEE, vol. 90, no. 6, pp. 969–986, Jun. 2002.
-
(2002)
Proc. IEEE
, vol.90
, Issue.6
, pp. 969-986
-
-
Elasser, A.1
Chow, T.P.2
-
3
-
-
34848886072
-
Recent advances in high-voltage, high-frequency silicon-carbide power devices
-
Oct.
-
A. Hefner, S.-H. Ryu, B. Hull, D. Berning, C. Hood, J. M. Ortiz-Rodriguez, A. Rivera-Lopez, T. Duong, A. Akuffo, and M. Hernandez-Mora, “Recent advances in high-voltage, high-frequency silicon-carbide power devices”, in Conf. Rec. IEEE IAS Annu. Meeting, Oct. 2006, vol. 1, pp. 330–337.
-
(2006)
Conf. Rec. IEEE IAS Annu. Meeting
, vol.1
, pp. 330-337
-
-
Hefner, A.1
Ryu, S.-H.2
Hull, B.3
Berning, D.4
Hood, C.5
Ortiz-Rodriguez, J.M.6
Rivera-Lopez, A.7
Duong, T.8
Akuffo, A.9
Hernandez-Mora, M.10
-
4
-
-
48349091993
-
Design and analysis of a 270 kW five-level DC/DC converter for solid state transformer using 10 kV SiC power devices
-
Orlando, FL, Jun. 17–21
-
L. Yang, T. Zhao, J. Wang, and A. Q. Huang, “Design and analysis of a 270 kW five-level DC/DC converter for solid state transformer using 10 kV SiC power devices”, in Proc. IEEE PESC, Orlando, FL, Jun. 17–21, 2007, pp. 245–251.
-
(2007)
Proc. IEEE PESC
, pp. 245-251
-
-
Yang, L.1
Zhao, T.2
Wang, J.3
Huang, A.Q.4
-
5
-
-
4043173202
-
-
W. J. Choyke, H. Matsunami, and G. Pensl, Eds. Berlin, Germany: Springer-Verlag
-
A. Agarwal, S.-H. Ryu, and J. Palmour, Silicon Carbide: Recent Major Advances, W. J. Choyke, H. Matsunami, and G. Pensl, Eds. Berlin, Germany: Springer-Verlag, 2004, pp. 785–812.
-
(2004)
Silicon Carbide: Recent Major Advances
, pp. 785-812
-
-
Agarwal, A.1
Ryu, S.-H.2
Palmour, J.3
-
6
-
-
34247548849
-
10 kV, 5A 4H-SiC power DMOSFET
-
Naples, Italy, Jun.
-
S. H. Ryu, S. Krishnaswami, B. Hull, J. Richmond, A. Agarwal, and A. Hefner, “10 kV, 5A 4H-SiC power DMOSFET”, in Proc. 18th Int. Symp. Power Semicond. Devices IC's, Naples, Italy, Jun. 2006, pp. 1–4.
-
(2006)
Proc. 18th Int. Symp. Power Semicond. Devices IC's
, pp. 1-4
-
-
Ryu, S.H.1
Krishnaswami, S.2
Hull, B.3
Richmond, J.4
Agarwal, A.5
Hefner, A.6
-
7
-
-
49249121553
-
Characterization, modeling and application of 10 kV SiC MOSFET
-
Aug.
-
J. Wang, T. Zhao, J. Li, A. Q. Huang, R. Callanan, F. Husna, and A. Agarwal, “Characterization, modeling and application of 10 kV SiC MOSFET”, IEEE Trans. Electron Devices, vol. 55, no. 8, pp. 1798–1806, Aug. 2008.
-
(2008)
IEEE Trans. Electron Devices
, vol.55
, Issue.8
, pp. 1798-1806
-
-
Wang, J.1
Zhao, T.2
Li, J.3
Huang, A.Q.4
Callanan, R.5
Husna, F.6
Agarwal, A.7
-
8
-
-
0033097598
-
Study of interface state density and effective oxide charge in post-metallization annealed Si02-SiC structures
-
Mar.
-
J. Campi, Y. Shi, Y. Luo, F. Yan, and J. H. Zhao “Study of interface state density and effective oxide charge in post-metallization annealed Si02-SiC structures,” IEEE Trans. Electron Devices, vol. 46, no. 3, pp. 511–519, Mar. 1999.
-
(1999)
IEEE Trans. Electron Devices
, vol.46
, Issue.3
, pp. 511-519
-
-
Campi, J.1
Shi, Y.2
Luo, Y.3
Yan, F.4
Zhao, J.H.5
-
9
-
-
38449111941
-
An approach of model temperature effects of interface traps in 4H-SiC
-
R. Rao, S. Balaji, K. Matocha, and V. Tilak, “An approach of model temperature effects of interface traps in 4H-SiC”, Mater. Sci. Forum, vol. 556/557, pp. 497–500, 2007.
-
(2007)
Mater. Sci. Forum
, vol.556/557
, pp. 497-500
-
-
Rao, R.1
Balaji, S.2
Matocha, K.3
Tilak, V.4
-
10
-
-
0022131832
-
A SPICE II subcircuit representation for power MOSFETs using empirical methods
-
Sep.
-
G. M. Dolny, H. R. Ronan, Jr., and C. F. Wheatley, Jr. “A SPICE II subcircuit representation for power MOSFETs using empirical methods,” RCA Rev., vol. 46, no. 3, pp. 308–320, Sep. 1985.
-
(1985)
RCA Rev.
, vol.46
, Issue.3
, pp. 308-320
-
-
Dolny, G.M.1
Ronan, H.R.2
Wheatley, C.F.3
-
11
-
-
0031364225
-
A new PSpice power MOSFET model with temperature dependent parameters: Evaluation of performances and comparison with available models
-
Oct.
-
C. Leonardi, A. Raciti, F. Frisina, and R. Letor, “A new PSpice power MOSFET model with temperature dependent parameters: Evaluation of performances and comparison with available models”, in Conf. Rec. IEEE IAS Annu. Meeting, Oct. 1997, vol. 2, pp. 1174–1181.
-
(1997)
Conf. Rec. IEEE IAS Annu. Meeting
, vol.2
, pp. 1174-1181
-
-
Leonardi, C.1
Raciti, A.2
Frisina, F.3
Letor, R.4
-
12
-
-
0036445030
-
Empirical power MOSFET modeling: Practical characterization and simulation implantation
-
Oct. 13–18
-
G. Verneau, L. Aubard, J.-C. Crebier, C. Schaeffer, and J.-L. Schanen, “Empirical power MOSFET modeling: Practical characterization and simulation implantation”, in Conf. Rec. IEEE IAS Annu. Meeting, Oct. 13–18, 2002, vol. 4, pp. 2425–2432.
-
(2002)
Conf. Rec. IEEE IAS Annu. Meeting
, vol.4
, pp. 2425-2432
-
-
Verneau, G.1
Aubard, L.2
Crebier, J.-C.3
Schaeffer, C.4
Schanen, J.-L.5
-
13
-
-
0031233099
-
A unified diode model for circuit simulation
-
Sep.
-
H. A. Mantooth and J. L. Duliere, “A unified diode model for circuit simulation”, IEEE Trans. Power Electron., vol. 12, no. 5, pp. 816–823, Sep. 1997.
-
(1997)
IEEE Trans. Power Electron.
, vol.12
, Issue.5
, pp. 816-823
-
-
Mantooth, H.A.1
Duliere, J.L.2
-
14
-
-
72449197461
-
Characterization, modeling of 10-kV SiC JBS diodes and their application prospect in X-ray generators
-
Sep.
-
J. Wang, Y. Du, S. Bhattacharya, and A. Q. Huang, “Characterization, modeling of 10-kV SiC JBS diodes and their application prospect in X-ray generators”, in Conf. Rec. IEEE IAS Annu. Meeting, Sep. 2009, vol. 1, pp. 1488–1493.
-
(2009)
Conf. Rec. IEEE IAS Annu. Meeting
, vol.1
, pp. 1488-1493
-
-
Wang, J.1
Du, Y.2
Bhattacharya, S.3
Huang, A.Q.4
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