In-situ two-step Raman thermometry for thermal characterization of monolayer graphene interface material

Applied Thermal Engineering

Volumn 113, Issue , 2017, Pages 481-489

  Zhao, Wenqiang ^a,b   Chen, Wen ^a   Yue, Yanan ^a,c   Wu, Shijing ^a  

^a WUHAN UNIVERSITY   (China)

^b STATE GRID CORPORATION OF CHINA   (China)

^c BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

Graphene; Interfacial thermal conductance; Raman thermometry; Thermal conductivity

Indexed keywords

CHARACTERIZATION; GRAIN SIZE AND SHAPE; GRAPHENE; HYBRID MATERIALS; INTERFACES (MATERIALS); MONOLAYERS; THERMODYNAMIC PROPERTIES; THERMOMETERS;

DIRECT MEASUREMENT; INTERFACE MATERIALS; INTERFACE STRUCTURES; RAMAN THERMOMETRY; THERMAL CHARACTERIZATION; THERMAL CONDUCTANCE; THERMAL CONDUCTIVITY MEASUREMENTS; THERMAL PROPERTY MEASUREMENTS;

THERMAL CONDUCTIVITY;

EID: 84995587992     PISSN: 13594311     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.applthermaleng.2016.11.063     Document Type: Article

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