Noncontact sub-10 nm temperature measurement in near-field laser heating

ACS Nano

Volumn 5, Issue 6, 2011, Pages 4466-4475

  Yue, Yanan ^a   Chen, Xiangwen ^a   Wang, Xinwei ^a  

^a Iowa State University   (United States)

Author keywords

ballistic thermal transport; near field laser heating; sub 10 nm; thermal probing

Indexed keywords

AFM TIP; AVALANCHE BREAKDOWN; COMBINED EFFECT; EXPERIMENTAL CONDITIONS; FOCUSED LASER; HIGH INTENSITY; HIGH TEMPERATURE; INCIDENT LASER; LASER POLARIZATION; LOW THERMAL CONDUCTIVITY; MEASUREMENT RESULTS; NEAR-FIELD; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; NON-CONTACT; OPTICAL FIELD; OPTICAL FIELD INTENSITY; PHOTON ABSORPTIONS; POLARIZATION ANGLE; STRUCTURE CHARACTERIZATION; SUB-10 NM; SURFACE NANOSTRUCTURING; TEMPERATURE RISE; THERMAL CONTACT RESISTANCE; THERMAL PROBING; THERMAL TRANSPORT; WELL-ALIGNED;

ABSORPTION; BALLISTICS; HEAT RESISTANCE; HEATING; LASER HEATING; PHOTONS; POLARIZATION; SURFACE STRUCTURE; TEMPERATURE MEASUREMENT;

THERMAL CONDUCTIVITY;

SILICON;

ABSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; HEAT; HEATING; KINETICS; LASER; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; OPTICS; PHOTON; RAMAN SPECTROMETRY; TEMPERATURE; THERMAL CONDUCTIVITY;

ABSORPTION; HEATING; HOT TEMPERATURE; KINETICS; LASERS; MICROSCOPY; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; OPTICS AND PHOTONICS; PHOTONS; SILICON; SPECTRUM ANALYSIS, RAMAN; TEMPERATURE; THERMAL CONDUCTIVITY;

EID: 79959808381     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn2011442     Document Type: Article

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