Observing the evolution of graphene layers at high current density

Nano Research

Volumn 9, Issue 12, 2016, Pages 3663-3670

  Huang, Chun Wei ^a   Chen, Jui Yuan ^a   Chiu, Chung Hua ^a   Hsin, Cheng Lun ^b   Tseng, Tseung Yuen ^a   Wu, Wen Wei ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b Central University   (China)

Author keywords

breakdown; graphene; high current density; in situ transmission electron microscope (TEM); Ostwald ripening

Indexed keywords

CURRENT DENSITY; ELECTRIC FIELD EFFECTS; ELECTRON EMISSION; GRAPHENE DEVICES; IN SITU PROCESSING; OSTWALD RIPENING; TRANSMISSION ELECTRON MICROSCOPY;

BREAKDOWN; BREAKDOWN BEHAVIOR; BREAKDOWN MECHANISM; HIGH CURRENT DENSITIES; IN-SITU TRANSMISSION; MORPHOLOGICAL EVOLUTION; MULTILAYER GRAPHENE; SUSPENDED GRAPHENE;

GRAPHENE;

EID: 84988385316     PISSN: 19980124     EISSN: 19980000     Source Type: Journal    
DOI: 10.1007/s12274-016-1237-0     Document Type: Article

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