Deep reflectance maps

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 2016-December, Issue , 2016, Pages 4508-4516

  Rematas, Konstantinos ^a   Ritschel, Tobias ^b   Fritz, Mario ^c   Gavves, Efstratios ^d   Tuytelaars, Tinne ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c MAX PLANCK INSTITUTE FOR INFORMATICS   (Germany)

^d UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; INVERSE PROBLEMS;

IMAGE FORMATION PROCESS; INTRINSIC PROPERTY; LEARNING FORMULATION; NATURAL LIGHTING; NEURAL ARCHITECTURES; SPECULAR MATERIALS; SURFACE ORIENTATION; UNDER-CONSTRAINED;

REFLECTION;

EID: 84986317476     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2016.488     Document Type: Conference Paper

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