Recent prospects in the inline monitoring of nanocomposites and nanocoatings by optical technologies

Nanomaterials

Volumn 6, Issue 8, 2016, Pages

  Bugnicourt, Elodie ^a   Kehoe, Timothy ^b   Latorre, Marcos ^c   Serrano, Cristina ^a   Philippe, Séverine ^b   Schmid, Markus ^d,e  

^a Parc Mediterrani de la Tecnologia   (Spain)

^b UNIVERSITY COLLEGE DUBLIN   (Ireland)

^c ITENE (Packaging Transport and Logistics Research Institute)   (Spain)

^d FRAUNHOFER INSTITUTE FOR PROCESS ENGINEERING AND PACKAGING IVV   (Germany)

^e TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Dispersion; Ellipsometry; Inline monitoring; Nanocoatings; Nanocomposites; Spectral reflectance; Spectroscopy; Thickness

Indexed keywords

EID: 84983350425     PISSN: None     EISSN: 20794991     Source Type: Journal    
DOI: 10.3390/nano6080150     Document Type: Review

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