New developments in particle characterization by laser diffraction: Size and shape

Powder Technology

Volumn 111, Issue 1-2, 2000, Pages 66-78

  Ma, Zhenhua ^a   Merkus, Henk G ^a   De Smet, Jan G A E ^a   Heffels, Camiel ^a   Scarlett, Brian ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Laser diffraction; On line sensor; Particle shape; Particle size

Indexed keywords

CORRELATION METHODS; ELECTROMAGNETIC WAVE DIFFRACTION; LASER APPLICATIONS; LIGHT SCATTERING; OPTICAL SENSORS; PHOTODETECTORS;

FOURIER ANALYSIS; LASER DIFFRACTION; PRINCIPAL COMPONENT ANALYSIS (PCA);

PARTICLE SIZE ANALYSIS;

DIFFRACTION; LASER MEASUREMENT; PARTICLE SIZE DISTRIBUTION; SHAPE;

ARTICLE; LASER DIFFRACTION; ONLINE SYSTEM; PARTICLE SIZE; SENSOR; TECHNIQUE;

EID: 0034699246     PISSN: 00325910     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-5910(00)00242-4     Document Type: Article

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