Non-rigid alignment in electron tomography in materials science

Journal of Microscopy

Volumn 263, Issue 3, 2016, Pages 312-319

  Printemps, Tony ^a,b   Bernier, Nicolas ^a,b   Bleuet, Pierre ^a,b   Mula, Guido ^c   Hervé, Lionel ^a,b  

^a UNIV GRENOBLE ALPES   (France)

^b CEA GRENOBLE   (France)

^c UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

3D; deformation; electron tomography; non rigid alignment; non rigid registration

Indexed keywords

ERBIUM; SILICON;

ALGORITHM; ARTICLE; ARTIFACT; ELECTRON; ELECTRON BEAM; ELECTRON TOMOGRAPHY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; IMAGE QUALITY; IMAGE RECONSTRUCTION; NON RIGID ALIGNMENT; PRIORITY JOURNAL; SPECTROSCOPY;

EID: 84982144061     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12400     Document Type: Article

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