Optimized imaging using non-rigid registration

Ultramicroscopy

Volumn 138, Issue , 2014, Pages 46-56

  Berkels, Benjamin ^a,b   Binev, Peter ^a   Blom, Douglas A ^a   Dahmen, Wolfgang ^a,b   Sharpley, Robert C ^a   Vogt, Thomas ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Diffusion registration; HAADF STEM; IQ factor; Non rigid registration; Si Y zeolite

Indexed keywords

EID: 84893698761     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.11.007     Document Type: Article

References (25)

1. Binev P., Blanco-Silva F., Blom D., Dahmen W., Lamby P., Sharpley R., Vogt T. High-quality image formation by nonlocal means applied to high-angle annular dark-field scanning transmission electron microscopy (HAADFSTEM). Modeling Nanoscale Imaging in Electron Microscopy, Nanostructure Science and Technology 2012, 127-145. Springer, US. T. Vogt, W. Dahmen, P. Binev (Eds.).
2. Leary R., Midgley P.A., Thomas J.M. Recent advances in the application of electron tomography to materials chemistry. Acc. Chem. Res. 2012, 45(10):1782.
3. Nickell S., Frster F., Linaroudis A., Net W.D., Beck F., Hegerl R., Baumeister W., Plitzko J.M. TOM software toolbox. acquisition and analysis for electron tomography. J. Struct. Biol. 2005, 149(3):227.
4. Ugurlu O., Haus J., Gunawan A.A., Thomas M.G., Maheshwari S., Tsapatsis M., Mkhoyan K.A. Radiolysis to knock-on damage transition in zeolites under electron beam irradiation. Phys. Rev. B 2011, 83(113408).
5. Treacy M.M.J., Newsam J.M. Electron beam sensitivity of zeolite L. Ultramicroscopy 1987, 23:411.
6. Bursill L.A., Lodge E.A., Thomas J.M. Zeolitic structures as revealed by high-resolution electron microscopy. Nature 1980, 286:111.
7. Pan M. High resolution electron microscopy of zeolites. Micron 1996, 27(3-4):219.
8. Thomas J.M., Terasaki O., Gai P., Zhou W., Gonzalez-Calbet J. Structural elucidation of microporous and mesoporous catalysts and molecular sieves by high-resolution electron microscopy. Acc. Chem. Res. 2001, 34:583.
9. Diaz I., Mayoral A. TEM Studies of zeolites and ordered mesoporous materials. Micron 2011, 42:512.
10. Ozkaya D., Zhou W., Thomas J.M., Midgeley P., Keast V.J., Hermans S. High-resolution imaging of nanoparticle bimetallic catalysts supported on mesoporous silica. Catal. Lett. 1999, 60:113.
11. Thomas J.M., Sparrow T.G., Uppal M.K., Williams B.G. Chemical analyses and studies of electronic-structure of solids by electron-energy loss spectroscopy with an electron microscope. Philos. Trans. R. Soc. London Ser. A 1984, 318:259.
12. Krivanek O.L., Delby N., Lupini A.R. Towards sub-Å electron beams. Ultramicroscopy 1999, 78:1.
13. Ortalan V., Uzan A., Gates B.C., Browning N.D. Direct imaging of single metal atoms and clusters in the pores of dealuminated HY zeolite. Nat. Nanotechnol. 2010, 5:506.
14. 29Si MAS NMR studies of siliceous zeolite-Y. J. Solid State Chem. 1993, 106(1):66.
15. Kirkland E.J. Advanced Computing in Electron Microscopy 1998, Plenum, New York.
16. Modersitzki J. Numerical Methods for Image Registration 2004, Oxford University Press.
17. U. Clarenz, M. Droske, M. Rumpf, Towards fast non-rigid registration, in: Inverse Problems, Image Analysis and Medical Imaging, AMS Special Session Interaction of Inverse Problems and Image Analysis (AMS2002), vol. 313, 2012, pp. 67-84.
18. Han J., Berkels B., Droske M., Hornegger J., Rumpf M., Schaller C., Scorzin J., Urbach H. Mumford-Shah model for one-to-one edge matching. IEEE Trans. Image Process. 2007, 16(11):2720.
19. Briggs W. A Multigrid Tutorial 1987, Society for Industrial and Applied Mathematics (SIAM), Philadelphia.
20. Hackbusch W. Multigrid Methods and Applications, Springer Series in Computational Mathematics 1985, vol. 4. Springer-Verlag, Berlin.
21. Sundaramoorthi G., Yezzi A., Mennucci A. Sobolev active contours. Int. J. Comput. Vis. 2007, 73(3):345.
22. Braess D. Finite Elements 2007, Cambridge University Press. 3rd ed.
23. J. Stoer, R. Bulirsch, Introduction to numerical analysis, in: Texts in Applied Mathematics, 3rd ed., vol. 12, Springer, New York, 2002 (Translated from the German by R. Bartels, W. Gautschi and C. Witzgall).
24. Armijo L. Minimization of functions having Lipschitz continuous first partial derivatives. Pac. J. Math. 1966, 16(1):1.
25. Unwin P., Henderson R. Molecular structure determination by electron microscopy of unstained crystalline specimens. J. Mol. Biol. 1975, 94:425.