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Volumn , Issue , 2000, Pages 91-98

Influences of pad shape and solder microstructure on shear force of low cost flip chip bumps

Author keywords

[No Author keywords available]

Indexed keywords

CHIP SCALE PACKAGES; COSTS; ELECTROLESS PLATING; FLIP CHIP DEVICES; FRACTURE; HYDROGEN EMBRITTLEMENT; MODIFIED ATMOSPHERE PACKAGING; NICKEL; SOLDERING ALLOYS; STUDS (FASTENERS); STUDS (STRUCTURAL MEMBERS);

EID: 84954219534     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMAP.2000.904138     Document Type: Conference Paper
Times cited : (12)

References (21)
  • 2
    • 0013386098 scopus 로고    scopus 로고
    • Wafer bumping technology - A comparative analysis of solder deposition process and assembly considerations
    • ASME
    • Deborah S. Patterson, Peter Elenius, James A. Leal, Wafer Bumping Technology-A Comparative Analysis of Solder Deposition Process and Assembly Considerations, Advances in Electronic Packaging-1997, Vol 1, 337-351, ASME 1997.
    • (1997) Advances in Electronic Packaging-1997 , vol.1 , pp. 337-351
    • Patterson, D.S.1    Elenius, P.2    Leal, J.A.3
  • 5
    • 34250849563 scopus 로고    scopus 로고
    • IMS-injection molded soldering
    • David Danovitch, Peter A. Gruber, IMS-Injection Molded Soldering, IMAPS 2000,449-453.
    • (2000) IMAPS , pp. 449-453
    • Danovitch, D.1    Gruber, P.A.2
  • 6
    • 0008563244 scopus 로고    scopus 로고
    • Low cost flip chip based on chemical nickel bumping and solder printing
    • Joachim Kloeser, Andreas Ostmann, etc, Low Cost Flip Chip Based on Chemical Nickel Bumping and Solder Printing, ISHM'96 Proceedings, 93-102.
    • ISHM'96 Proceedings , pp. 93-102
    • Kloeser, J.1    Ostmann, A.2
  • 10
    • 0032688683 scopus 로고    scopus 로고
    • Recent advances in flip chip wafer bumping using solder paste technology
    • Peter Elenius, Jim Leal, Joe Ney, Dave Stepniak, Shing Yeh, Recent Advances in Flip Chip Wafer Bumping using Solder Paste Technology, 1999 ECTC.
    • (1999) ECTC
    • Elenius, P.1    Leal, J.2    Ney, J.3    Stepniak, D.4    Yeh, S.5
  • 11
    • 0027132112 scopus 로고
    • The pre-treatment of al bondpads for electroless nickel bumping
    • Santa Cruz, CA
    • A. Ostmann, J. Simon, H. Reichl, The pre-treatment of Al Bondpads for Electroless Nickel Bumping, Proceeding of IEEE MCM Conference, Santa Cruz, CA, 1993,748-751.
    • (1993) Proceeding of IEEE MCM Conference , pp. 748-751
    • Ostmann, A.1    Simon, J.2    Reichl, H.3
  • 12
    • 0032230479 scopus 로고    scopus 로고
    • The effects of immersion zincation to he electroless nickel under-bump materials in microelectronics packaging
    • Ng Wei-Chin, Ko Tze-Man, William Chen, Qi Guo-Jun, The Effects of Immersion Zincation to he Electroless Nickel Under-Bump Materials in Microelectronics Packaging, 1998 IEEE/CPMT EPTC, 89-94.
    • (1998) IEEE/CPMT EPTC , pp. 89-94
    • Ng, W.-C.1    Ko, T.-M.2    William, C.3    Qi, G.-J.4
  • 13
    • 0031636970 scopus 로고    scopus 로고
    • Reliability and process characterization of electroless nickel-gold/solder flip chip interconnect technology
    • Susan Wiegele, Pat Thormpson, Russ Lee, Eric Ramsland, Reliability and Process Characterization of Electroless Nickel-Gold/Solder Flip Chip Interconnect Technology, 1998 ECTC, 861-866.
    • (1998) ECTC , pp. 861-866
    • Susan, W.1    Thormpson, P.2    Lee, R.3    Ramsland, E.4
  • 16
    • 0033320370 scopus 로고    scopus 로고
    • Manufacturing of cu/electroless nickel/sn-pb flip chip solder bumps
    • Kwang-Lung Lin, Yi-Cheng Liu, Manufacturing of Cu/Electroless Nickel/Sn-Pb Flip Chip Solder Bumps, IEEE Transaction on Advanced Packaging, Vol. 22, No.4, 1999.
    • (1999) IEEE Transaction on Advanced Packaging , vol.22 , Issue.4
    • Lin, K.-L.1    Liu, Y.-C.2
  • 17
    • 0028494896 scopus 로고
    • The interaction kinetics and compound formation between electroless Ni-P and solder
    • Chwan-Ying Lee, Kwang-Lung Lin, The interaction kinetics and compound formation between electroless Ni-P and solder, Thin Solid Films, 249(1994), 201-206.
    • (1994) Thin Solid Films , vol.249 , pp. 201-206
    • Lee, C.-Y.1    Lin, K.-L.2
  • 18
    • 0034248629 scopus 로고    scopus 로고
    • The reactions between electroless ni-cu-p deposit and 63sn-37pb flip chip solder bumps during reflow
    • Chun-Jen Chen and Kwang-Lung Lin, The Reactions between Electroless Ni-Cu-P Deposit and 63Sn-37Pb Flip Chip Solder Bumps during Reflow, Journal of Electronic Materials, Vol. 29, no. 8, 1007-1014
    • Journal of Electronic Materials , vol.29 , Issue.8 , pp. 1007-1014
    • Chen, C.-J.1    Lin, K.-L.2
  • 20
    • 0000741863 scopus 로고    scopus 로고
    • Electron microscopy study of interfacial reaction between eutectic SnPb and Cu/Ni(V)/Al thin film metallization
    • C. Y. Liu, K. N. Tu, T. T. Sheng, C. H. Tung, D. R. Frear, and P. Elenius, Electron microscopy study of interfacial reaction between eutectic SnPb and Cu/Ni(V)/Al thin film metallization, J. Appl. Phys. 87, 750-754,2000.
    • (2000) J. Appl. Phys , vol.87 , pp. 750-754
    • Liu, C.Y.1    Tu, K.N.2    Sheng, T.T.3    Tung, C.H.4    Frear, D.R.5    Elenius, P.6
  • 21
    • 0031635717 scopus 로고    scopus 로고
    • The effects of interfaces on c-4 solder bump reliability
    • Michael J. Sullivan, The Effects of Interfaces on C-4 Solder Bump Reliability, MRS Symp. Proc. Vol. 515, 1998,55-66.
    • (1998) MRS Symp. Proc , vol.515 , pp. 55-66
    • Sullivan, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.