-
2
-
-
0013386098
-
Wafer bumping technology - A comparative analysis of solder deposition process and assembly considerations
-
ASME
-
Deborah S. Patterson, Peter Elenius, James A. Leal, Wafer Bumping Technology-A Comparative Analysis of Solder Deposition Process and Assembly Considerations, Advances in Electronic Packaging-1997, Vol 1, 337-351, ASME 1997.
-
(1997)
Advances in Electronic Packaging-1997
, vol.1
, pp. 337-351
-
-
Patterson, D.S.1
Elenius, P.2
Leal, J.A.3
-
4
-
-
0034476304
-
-
ECTC
-
Guowei Xiao, Philip Chan, Cai Jian, Annette Teng, Matthew Yuen, The Effect of Cu Stud Structure and Eutectic Solder Electroplating on Intermetallic Growth and Reliability of Flip-Chip Solder Bump, 2000 ECTC, 54-59.
-
(2000)
The Effect of Cu Stud Structure and Eutectic Solder Electroplating on Intermetallic Growth and Reliability of Flip-Chip Solder Bump
, pp. 54-59
-
-
Xiao, G.1
Chan, P.2
Jian, C.3
Teng, A.4
Yuen, M.5
-
5
-
-
34250849563
-
IMS-injection molded soldering
-
David Danovitch, Peter A. Gruber, IMS-Injection Molded Soldering, IMAPS 2000,449-453.
-
(2000)
IMAPS
, pp. 449-453
-
-
Danovitch, D.1
Gruber, P.A.2
-
6
-
-
0008563244
-
Low cost flip chip based on chemical nickel bumping and solder printing
-
Joachim Kloeser, Andreas Ostmann, etc, Low Cost Flip Chip Based on Chemical Nickel Bumping and Solder Printing, ISHM'96 Proceedings, 93-102.
-
ISHM'96 Proceedings
, pp. 93-102
-
-
Kloeser, J.1
Ostmann, A.2
-
7
-
-
0032311889
-
Polf aschenbrennerand herbert reichl
-
International Symposium on Microelectronics
-
Joachim Kloeser, Katrin Heinricht, Erik Jung, Liane Lauter, Andreas Ostmann, Polf Aschenbrennerand Herbert Reichl, Low cost Bumping by stencil printing: Process qualification for 200pm pitch, 1998, International Symposium on Microelectronics, 288-298.
-
(1998)
Low Cost Bumping by Stencil Printing: Process Qualification for 200pm Pitch
, pp. 288-298
-
-
Kloeser, J.1
Heinricht, K.2
Jung, E.3
Lauter, L.4
Ostmann, A.5
-
8
-
-
0033323381
-
Fine pitch low-cost bumping for flip chip technology
-
Szu-Wei Lu, Ruoh-Huey Uang, Kuo-Chuan Chen, Hsu-Tien Hu, Ling-chen Kung and Hsin-Chien Huang, Fine Pitch Low-Cost Bumping for Flip Chip Technology, 1999 IEEE/CPMT-EMPT Symposium, 127-130.
-
(1999)
IEEE/CPMT-EMPT Symposium
, pp. 127-130
-
-
Lu, S.-W.1
Uang, R.-H.2
Chen, K.-C.3
Hu, H.-T.4
Kung, L.-C.5
Huang, H.-C.6
-
10
-
-
0032688683
-
Recent advances in flip chip wafer bumping using solder paste technology
-
Peter Elenius, Jim Leal, Joe Ney, Dave Stepniak, Shing Yeh, Recent Advances in Flip Chip Wafer Bumping using Solder Paste Technology, 1999 ECTC.
-
(1999)
ECTC
-
-
Elenius, P.1
Leal, J.2
Ney, J.3
Stepniak, D.4
Yeh, S.5
-
11
-
-
0027132112
-
The pre-treatment of al bondpads for electroless nickel bumping
-
Santa Cruz, CA
-
A. Ostmann, J. Simon, H. Reichl, The pre-treatment of Al Bondpads for Electroless Nickel Bumping, Proceeding of IEEE MCM Conference, Santa Cruz, CA, 1993,748-751.
-
(1993)
Proceeding of IEEE MCM Conference
, pp. 748-751
-
-
Ostmann, A.1
Simon, J.2
Reichl, H.3
-
12
-
-
0032230479
-
The effects of immersion zincation to he electroless nickel under-bump materials in microelectronics packaging
-
Ng Wei-Chin, Ko Tze-Man, William Chen, Qi Guo-Jun, The Effects of Immersion Zincation to he Electroless Nickel Under-Bump Materials in Microelectronics Packaging, 1998 IEEE/CPMT EPTC, 89-94.
-
(1998)
IEEE/CPMT EPTC
, pp. 89-94
-
-
Ng, W.-C.1
Ko, T.-M.2
William, C.3
Qi, G.-J.4
-
13
-
-
0031636970
-
Reliability and process characterization of electroless nickel-gold/solder flip chip interconnect technology
-
Susan Wiegele, Pat Thormpson, Russ Lee, Eric Ramsland, Reliability and Process Characterization of Electroless Nickel-Gold/Solder Flip Chip Interconnect Technology, 1998 ECTC, 861-866.
-
(1998)
ECTC
, pp. 861-866
-
-
Susan, W.1
Thormpson, P.2
Lee, R.3
Ramsland, E.4
-
16
-
-
0033320370
-
Manufacturing of cu/electroless nickel/sn-pb flip chip solder bumps
-
Kwang-Lung Lin, Yi-Cheng Liu, Manufacturing of Cu/Electroless Nickel/Sn-Pb Flip Chip Solder Bumps, IEEE Transaction on Advanced Packaging, Vol. 22, No.4, 1999.
-
(1999)
IEEE Transaction on Advanced Packaging
, vol.22
, Issue.4
-
-
Lin, K.-L.1
Liu, Y.-C.2
-
17
-
-
0028494896
-
The interaction kinetics and compound formation between electroless Ni-P and solder
-
Chwan-Ying Lee, Kwang-Lung Lin, The interaction kinetics and compound formation between electroless Ni-P and solder, Thin Solid Films, 249(1994), 201-206.
-
(1994)
Thin Solid Films
, vol.249
, pp. 201-206
-
-
Lee, C.-Y.1
Lin, K.-L.2
-
18
-
-
0034248629
-
The reactions between electroless ni-cu-p deposit and 63sn-37pb flip chip solder bumps during reflow
-
Chun-Jen Chen and Kwang-Lung Lin, The Reactions between Electroless Ni-Cu-P Deposit and 63Sn-37Pb Flip Chip Solder Bumps during Reflow, Journal of Electronic Materials, Vol. 29, no. 8, 1007-1014
-
Journal of Electronic Materials
, vol.29
, Issue.8
, pp. 1007-1014
-
-
Chen, C.-J.1
Lin, K.-L.2
-
19
-
-
1542344143
-
Crystallization of electroless Ni-P under bump metallisation induced by solder reaction
-
J. W. Jang, P. G. Kim, K. N. Tu and D. R. Frear, Crystallization of electroless Ni-P under bump metallisation induced by solder reaction, 252-255, 1999 International Symposium on Advanced packaging Materials.
-
(1999)
International Symposium on Advanced Packaging Materials
, pp. 252-255
-
-
Jang, J.W.1
Kim, P.G.2
Tu, K.N.3
Frear, D.R.4
-
20
-
-
0000741863
-
Electron microscopy study of interfacial reaction between eutectic SnPb and Cu/Ni(V)/Al thin film metallization
-
C. Y. Liu, K. N. Tu, T. T. Sheng, C. H. Tung, D. R. Frear, and P. Elenius, Electron microscopy study of interfacial reaction between eutectic SnPb and Cu/Ni(V)/Al thin film metallization, J. Appl. Phys. 87, 750-754,2000.
-
(2000)
J. Appl. Phys
, vol.87
, pp. 750-754
-
-
Liu, C.Y.1
Tu, K.N.2
Sheng, T.T.3
Tung, C.H.4
Frear, D.R.5
Elenius, P.6
-
21
-
-
0031635717
-
The effects of interfaces on c-4 solder bump reliability
-
Michael J. Sullivan, The Effects of Interfaces on C-4 Solder Bump Reliability, MRS Symp. Proc. Vol. 515, 1998,55-66.
-
(1998)
MRS Symp. Proc
, vol.515
, pp. 55-66
-
-
Sullivan, M.J.1
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