In Situ and Real-Time Inspection of Nanoparticle Average Size in Flexible Printed Sensors

Journal of Physical Chemistry C

Volumn 119, Issue 49, 2015, Pages 27521-27528

  Segev Bar, Meital ^a   Ukrainsky, Ben ^a   Konvalina, Gady ^a   Haick, Hossam ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; NANOTECHNOLOGY; SUBSTRATES;

ELECTRICAL RESISTANCES; NANOPARTICLE DIAMETER; OFF-LINE PROCESSING; PRINTED ELECTRONICS; REAL-TIME ESTIMATION; REALTIME INSPECTION; STRAIN SENSITIVITY; UV-VIS ABSORPTIONS;

NANOPARTICLES;

EID: 84949486965     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/acs.jpcc.5b09340     Document Type: Article

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