SCOPUS 정보 검색 플랫폼

RSC Advances

Volumn 5, Issue 124, 2015, Pages 102741-102749

Highly transparent conducting cerium incorporated CdO thin films deposited by a spray pyrolytic technique

(5) Velusamy, P a Babu, R Ramesh a Ramamurthi, K b Dahlem, M S c Elangovan, E c

a BHARATHIDASAN UNIVERSITY (India)

b SRM INSTITUTE OF SCIENCE AND TECHNOLOGY (India)

c KHALIFA UNIVERSITY (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CERIUM; CONDUCTIVE FILMS; CRYSTALLITE SIZE; DEPOSITION; ENAMELS; ENERGY GAP; FIELD EMISSION MICROSCOPES; OXIDE FILMS; PHOTOLUMINESCENCE SPECTROSCOPY; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SPRAY PYROLYSIS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EMISSION PROPERTIES; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; LATTICE PARAMETER VALUES; PHOTOLUMINESCENCE SPECTRUM; PREFERENTIAL GROWTH ORIENTATION; SPRAY-PYROLYSIS TECHNIQUES; SURFACE MICROSTRUCTURES; X-RAY PHOTOELECTRONS;

THIN FILMS;

EID: 84948777912 PISSN: None EISSN: 20462069 Source Type: Journal
DOI: 10.1039/c5ra15262c Document Type: Article

Times cited : (75)

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