Effect of annealing temperature on structural, electrical and optical properties of spray pyrolytic nanocrystalline CdO thin films

Materials Science in Semiconductor Processing

Volumn 24, Issue 1, 2014, Pages 26-33

  Azizar Rahman, M ^a   Khan, M K R ^b  

^a BANGLADESH UNIVERSITY OF ENGINEERING AND TECHNOLOGY   (Bangladesh)

^b UNIVERSITY OF RAJSHAHI   (Bangladesh)

Author keywords

Annealing; Electrical properties; Optical properties; Structural properties

Indexed keywords

ELECTRIC PROPERTIES; GRAIN BOUNDARIES; OPTICAL CONDUCTIVITY; OPTICAL PROPERTIES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SPRAY PYROLYSIS; STRUCTURAL PROPERTIES; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

ANNEALING TEMPERATURES; DISLOCATION DENSITIES; ELECTRICAL AND OPTICAL PROPERTIES; N-TYPE SEMICONDUCTORS; SPRAY-PYROLYSIS TECHNIQUES; SUBSTRATE TEMPERATURE; TEMPERATURE DEPENDENT; X-RAY DIFFRACTION STUDIES;

ANNEALING;

EID: 84896972323     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2014.03.002     Document Type: Article

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