Structural, optical and electrical measurements on boron-doped CdO thin films

Journal of Materials Science

Volumn 46, Issue 21, 2011, Pages 6925-6931

  Dakhel, A A ^a  

^a UNIVERSITY OF BAHRAIN   (Bahrain)

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAP NARROWING; BORON-DOPED; BORON-DOPING; CDO FILMS; CDO THIN FILMS; DC CONDUCTIVITY; DEGENERATE SEMICONDUCTORS; DONOR DOPING; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL MEASUREMENT; GLASS SUBSTRATES; INTERSTITIAL POSITIONS; ION VACANCY; IONS OCCUPIED; NEAR INFRARED; OPTOELECTRICAL PROPERTIES; VACUUM EVAPORATION TECHNIQUE; X-RAY DIFFRACTION STUDIES;

BORON; CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRIC PROPERTIES; ENERGY GAP; FILM PREPARATION; INFRARED DEVICES; OPTICAL PROPERTIES; SEMICONDUCTOR DOPING; SUBSTRATES; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION;

CADMIUM COMPOUNDS;

EID: 80052050411     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-011-5658-6     Document Type: Article

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