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Volumn 89, Issue 6, 2010, Pages

Measuring nanoscale stress intensity factors with an atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84948660169     PISSN: 02955075     EISSN: 12864854     Source Type: Journal    
DOI: 10.1209/0295-5075/89/66003     Document Type: Article
Times cited : (55)

References (25)
  • 3
    • 84948704177 scopus 로고    scopus 로고
    • PhD Thesis, Universiteacute; Montpellier 2, France
    • Célarié F. 2004 PhD Thesis, Université Montpellier 2, France
    • (2004)
    • Célarié, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.