Stress-enhanced ion diffusion at the vicinity of a crack tip as evidenced by atomic force microscopy in silicate glasses

Journal of Non-Crystalline Solids

Volumn 353, Issue 1, 2007, Pages 51-68

  Celarie F ^a   Ciccotti, M ^b   Marliere C ^c  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITÉ MONTPELLIER 2   (France)

^c UNIVERSITÉ MONTPELLIER 2   (France)

Author keywords

Atomic force and scanning tunneling microscopy; Crack growth; Diffusion and transport; Microstructure; Oxide glasses; Soda lime silica; Structural relaxation; Water

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK INITIATION; CRACK PROPAGATION; DIFFUSION; ENERGY DISSIPATION; MICROSTRUCTURE; SCANNING TUNNELING MICROSCOPY; WATER;

ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPY; DIFFUSION AND TRANSPORT; OXIDE GLASSES; SODA-LIME-SILICA; STRUCTURAL RELAXATION;

SILICATES;

EID: 33845203962     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.09.034     Document Type: Article

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