-
2
-
-
77749304288
-
Grain Boundary Engineering: An Overview after 25 Years
-
Randle, V. Grain Boundary Engineering: an Overview After 25 Years Mater. Sci. Technol. 2010, 26, 253-261 10.1179/026708309X12601952777747
-
(2010)
Mater. Sci. Technol.
, vol.26
, pp. 253-261
-
-
Randle, V.1
-
3
-
-
0031996840
-
Applications for Grain Boundary Engineered Materials
-
Palumbo, G.; Lehockey, L. M.; Lin, P. Applications for Grain Boundary Engineered Materials JOM 1998, 50, 40-43 10.1007/s11837-998-0248-z
-
(1998)
JOM
, vol.50
, pp. 40-43
-
-
Palumbo, G.1
Lehockey, L.M.2
Lin, P.3
-
4
-
-
84914168946
-
Grain Boundary Engineering for Improved Thin Silicon Photovoltaics
-
Raghunathan, R.; Johlin, E.; Grossman, J. C. Grain Boundary Engineering for Improved Thin Silicon Photovoltaics Nano Lett. 2014, 14, 4943-4950 10.1021/nl501020q
-
(2014)
Nano Lett.
, vol.14
, pp. 4943-4950
-
-
Raghunathan, R.1
Johlin, E.2
Grossman, J.C.3
-
5
-
-
84864720710
-
Review on Grain Boundaries in Graphene, Curved Poly- and Nanocrystalline Graphene Structures as New Carbon Allotropes
-
Ovid'ko, I. A. Review on Grain Boundaries in Graphene, Curved Poly- and Nanocrystalline Graphene Structures as New Carbon Allotropes Rev. Adv. Mater. Sci. 2012, 30, 201-224
-
(2012)
Rev. Adv. Mater. Sci.
, vol.30
, pp. 201-224
-
-
Ovid'Ko, I.A.1
-
6
-
-
84897696069
-
Grain Boundary Engineering in Atomically-Thin Nanosheets Achieving Bright White Light Emission
-
Xie, J.; Li, S.; Wang, R.; Zhang, H.; Xie, Y. Grain Boundary Engineering in Atomically-Thin Nanosheets Achieving Bright White Light Emission Chem. Sci. 2014, 5, 1328-1335 10.1039/c3sc53127a
-
(2014)
Chem. Sci.
, vol.5
, pp. 1328-1335
-
-
Xie, J.1
Li, S.2
Wang, R.3
Zhang, H.4
Xie, Y.5
-
7
-
-
84927931826
-
Grain Boundary Engineering at the Interface of Ceramic and Composite Materials Used in Alternative Energy Technologies
-
Saraf, L.; Darroudi, T.; Dillon, O.; Clarke, J. J.; Wetzel, G. Grain Boundary Engineering at the Interface of Ceramic and Composite Materials Used in Alternative Energy Technologies Microsc. Microanal. 2014, 20, 1910-1911 10.1017/S1431927614011283
-
(2014)
Microsc. Microanal.
, vol.20
, pp. 1910-1911
-
-
Saraf, L.1
Darroudi, T.2
Dillon, O.3
Clarke, J.J.4
Wetzel, G.5
-
8
-
-
84898996346
-
Grain-Boundary-Enhanced Carrier Collection in CdTe Solar Cells
-
Li, C.; Wu, Y.; Poplawsky, J.; Pennycook, T. J.; Paudel, N.; Yin, W.; Haigh, S. J.; Oxley, M. P.; Lupini, A. P.; Al-Jassim, M.; Pennycook, S. J.; Yan, Y. Grain-Boundary-Enhanced Carrier Collection in CdTe Solar Cells Phys. Rev. Lett. 2014, 112, 156103 10.1103/PhysRevLett.112.156103
-
(2014)
Phys. Rev. Lett.
, vol.112
, pp. 156103
-
-
Li, C.1
Wu, Y.2
Poplawsky, J.3
Pennycook, T.J.4
Paudel, N.5
Yin, W.6
Haigh, S.J.7
Oxley, M.P.8
Lupini, A.P.9
Al-Jassim, M.10
Pennycook, S.J.11
Yan, Y.12
-
9
-
-
79952936581
-
Grain Boundary Mapping in Polycrystalline Graphene
-
Kim, K.; Lee, Z.; Regan, W.; Kisielowski, C.; Crommie, M. F.; Zettl, A. Grain Boundary Mapping in Polycrystalline Graphene ACS Nano 2011, 5, 2142-2146 10.1021/nn1033423
-
(2011)
ACS Nano
, vol.5
, pp. 2142-2146
-
-
Kim, K.1
Lee, Z.2
Regan, W.3
Kisielowski, C.4
Crommie, M.F.5
Zettl, A.6
-
10
-
-
84865153744
-
Materials Interface Engineering for Solution-Processed Photovoltaics
-
Graetzel, M.; Janssen, R. A. J.; Mitzi, D. P.; Sargent, E. H. Materials Interface Engineering for Solution-Processed Photovoltaics Nature 2012, 488, 304-312 10.1038/nature11476
-
(2012)
Nature
, vol.488
, pp. 304-312
-
-
Graetzel, M.1
Janssen, R.A.J.2
Mitzi, D.P.3
Sargent, E.H.4
-
11
-
-
84863238161
-
Probing Grain Boundary Sink Strength at the Nanoscale: Energetics and Length Scales of Vacancy and Interstitial Absorption by Grain Boundaries in α-Fe
-
Tschopp, M. A.; Solanki, K. N.; Gao, F.; Sun, X.; Khaleel, M. A.; Horstemeyer, M. F. Probing Grain Boundary Sink Strength at the Nanoscale: Energetics and Length Scales of Vacancy and Interstitial Absorption by Grain Boundaries in α-Fe Phys. Rev. B: Condens. Matter Mater. Phys. 2012, 85, 064108 10.1103/PhysRevB.85.064108
-
(2012)
Phys. Rev. B: Condens. Matter Mater. Phys.
, vol.85
, pp. 064108
-
-
Tschopp, M.A.1
Solanki, K.N.2
Gao, F.3
Sun, X.4
Khaleel, M.A.5
Horstemeyer, M.F.6
-
12
-
-
79960844571
-
Grain Boundary Energy Anisotropy: A Review
-
Rohrer, G. S. Grain Boundary Energy Anisotropy: A Review J. Mater. Sci. 2011, 46, 5881-5895 10.1007/s10853-011-5677-3
-
(2011)
J. Mater. Sci.
, vol.46
, pp. 5881-5895
-
-
Rohrer, G.S.1
-
13
-
-
0034244454
-
Misorientation Dependence of the Grain Boundary Energy in Magnesia
-
Saylor, D. M.; Morawiec, A.; Adams, B. L.; Rohrer, G. S. Misorientation Dependence of the Grain Boundary Energy in Magnesia Interface Sci. 2000, 8, 131-140 10.1023/A:1008764219575
-
(2000)
Interface Sci.
, vol.8
, pp. 131-140
-
-
Saylor, D.M.1
Morawiec, A.2
Adams, B.L.3
Rohrer, G.S.4
-
14
-
-
84923367338
-
Combining Structural and Chemical Information at the Nanometer Scale by Correlative Transmission Electron Microscopy and Atom Probe Tomography
-
Herbig, M.; Choi, P.; Raabe, D. Combining Structural and Chemical Information at the Nanometer Scale by Correlative Transmission Electron Microscopy and Atom Probe Tomography Ultramicroscopy 2015, 153, 32-39 10.1016/j.ultramic.2015.02.003
-
(2015)
Ultramicroscopy
, vol.153
, pp. 32-39
-
-
Herbig, M.1
Choi, P.2
Raabe, D.3
-
15
-
-
84906255700
-
Grain Boundary Segregation Engineering in Metallic Alloys: A Pathway to the Design of Interfaces
-
Raabe, D.; Herbig, M.; Sandlöbes, M.; Li, Y.; Tytko, D.; Kuzmina, M.; Ponge, D.; Choi, P. P. Grain Boundary Segregation Engineering in Metallic Alloys: A Pathway to the Design of Interfaces Curr. Opin. Solid State Mater. Sci. 2014, 18, 253-261 10.1016/j.cossms.2014.06.002
-
(2014)
Curr. Opin. Solid State Mater. Sci.
, vol.18
, pp. 253-261
-
-
Raabe, D.1
Herbig, M.2
Sandlöbes, M.3
Li, Y.4
Tytko, D.5
Kuzmina, M.6
Ponge, D.7
Choi, P.P.8
-
16
-
-
79953781979
-
Grain Boundary Engineering: Historical Perspective and Future Prospects
-
Watanabe, T. Grain Boundary Engineering: Historical Perspective and Future Prospects J. Mater. Sci. 2011, 46, 4095-4115 10.1007/s10853-011-5393-z
-
(2011)
J. Mater. Sci.
, vol.46
, pp. 4095-4115
-
-
Watanabe, T.1
-
17
-
-
84877865199
-
Analysis of Variant Selection in Friction-Stir-Processed High-Strength Low-Alloy Steels
-
Abbasi, M.; Nelson, T. W.; Sorensen, C. D. Analysis of Variant Selection in Friction-Stir-Processed High-Strength Low-Alloy Steels J. Appl. Crystallogr. 2013, 46, 716-725 10.1107/S0021889813008522
-
(2013)
J. Appl. Crystallogr.
, vol.46
, pp. 716-725
-
-
Abbasi, M.1
Nelson, T.W.2
Sorensen, C.D.3
-
19
-
-
79960138352
-
Point Defects in Oxides: Tailoring Materials Through Defect Engineering
-
Tuller, H. L.; Bishop, S. R. Point Defects in Oxides: Tailoring Materials Through Defect Engineering Annu. Rev. Mater. Res. 2011, 41, 369-398 10.1146/annurev-matsci-062910-100442
-
(2011)
Annu. Rev. Mater. Res.
, vol.41
, pp. 369-398
-
-
Tuller, H.L.1
Bishop, S.R.2
-
20
-
-
84874572978
-
Transmission Electron Diffraction from Nanoparticles, Nanowires and Thin Films in an SEM with Conventional EBSD Equipment
-
Geiss, R. H.; Keller, R. R.; Read, D. T. Transmission Electron Diffraction from Nanoparticles, Nanowires and Thin Films in an SEM with Conventional EBSD Equipment Microsc. Microanal. 2010, 16, 1742-1743 10.1017/S1431927610062227
-
(2010)
Microsc. Microanal.
, vol.16
, pp. 1742-1743
-
-
Geiss, R.H.1
Keller, R.R.2
Read, D.T.3
-
21
-
-
84857356598
-
Transmission EBSD from 10 nm Domains in a Scanning Electron Microscope
-
Keller, R. R.; Geiss, R. H. Transmission EBSD from 10 nm Domains in a Scanning Electron Microscope J. Microsc. 2012, 245, 245-251 10.1111/j.1365-2818.2011.03566.x
-
(2012)
J. Microsc.
, vol.245
, pp. 245-251
-
-
Keller, R.R.1
Geiss, R.H.2
-
22
-
-
84864039679
-
Orientation Mapping of Nanostructured Materials Using Transmission Kikuchi Diffraction in the Scanning Electron Microscope
-
Trimby, P. T. Orientation Mapping of Nanostructured Materials Using Transmission Kikuchi Diffraction in the Scanning Electron Microscope Ultramicroscopy 2012, 120, 16-24 10.1016/j.ultramic.2012.06.004
-
(2012)
Ultramicroscopy
, vol.120
, pp. 16-24
-
-
Trimby, P.T.1
-
23
-
-
84883207617
-
Features of Transmission EBSD and its Application
-
Suzuki, S. Features of Transmission EBSD and its Application JOM 2013, 65, 1254-1263 10.1007/s11837-013-0700-6
-
(2013)
JOM
, vol.65
, pp. 1254-1263
-
-
Suzuki, S.1
-
24
-
-
84890796424
-
Acquisition Parameters Optimization of a Transmission Electron Forward Scatter Diffraction System in a Cold-Field Emission Scanning Electron Microscope for Nanomaterials Characterization
-
Brodusch, N.; Demers, H.; Trudeau, M.; Gauvin, R. Acquisition Parameters Optimization of a Transmission Electron Forward Scatter Diffraction System in a Cold-Field Emission Scanning Electron Microscope for Nanomaterials Characterization Scanning 2013, 35, 375-386 10.1002/sca.21078
-
(2013)
Scanning
, vol.35
, pp. 375-386
-
-
Brodusch, N.1
Demers, H.2
Trudeau, M.3
Gauvin, R.4
-
25
-
-
84874568626
-
Nanometers-Resolution Kikuchi Patterns from Materials Science Specimens with Transmission Electron Forward Scatter Diffraction in the Scanning Electron Microscope
-
Brodusch, N.; Demers, H.; Gauvin, R. Nanometers-Resolution Kikuchi Patterns from Materials Science Specimens with Transmission Electron Forward Scatter Diffraction in the Scanning Electron Microscope J. Microsc. 2013, 250, 1-14 10.1111/jmi.12007
-
(2013)
J. Microsc.
, vol.250
, pp. 1-14
-
-
Brodusch, N.1
Demers, H.2
Gauvin, R.3
-
26
-
-
84898852041
-
Transmission EBSD in the Scanning Electron Microscope
-
Geiss, R. H.; Rice, K. P.; Keller, R. R. Transmission EBSD in the Scanning Electron Microscope Microsc. Today 2013, 21, 16-20 10.1017/S1551929513000503
-
(2013)
Microsc. Today
, vol.21
, pp. 16-20
-
-
Geiss, R.H.1
Rice, K.P.2
Keller, R.R.3
-
27
-
-
84873365540
-
Thermal Stability of Ni/NiO Multilayers
-
Kacher, J.; Elizaga, P.; House, S. D.; Hattar, K.; Nowell, M.; Robertson, I. M. Thermal Stability of Ni/NiO Multilayers Mater. Sci. Eng., A 2013, 568, 49-60 10.1016/j.msea.2013.01.033
-
(2013)
Mater. Sci. Eng., A
, vol.568
, pp. 49-60
-
-
Kacher, J.1
Elizaga, P.2
House, S.D.3
Hattar, K.4
Nowell, M.5
Robertson, I.M.6
-
28
-
-
84927928857
-
Thickness-Dependent Beam Broadening in Transmission EBSD
-
Rice, K. P.; Keller, R. R. Thickness-Dependent Beam Broadening in Transmission EBSD Microsc. Microanal. 2014, 20, 854-855 10.1017/S1431927614005996
-
(2014)
Microsc. Microanal.
, vol.20
, pp. 854-855
-
-
Rice, K.P.1
Keller, R.R.2
-
29
-
-
84906718923
-
The Microstructure and Microtexture of Zirconium Oxide Films Studied by Transmission Electron Backscatter Diffraction and Automated Crystal Orientation Mapping with Transmission Electron Microscopy
-
Garner, A.; Gholinia, A.; Frankel, P.; Gass, M.; MacLaren, I.; Preuss, M. The Microstructure and Microtexture of Zirconium Oxide Films Studied by Transmission Electron Backscatter Diffraction and Automated Crystal Orientation Mapping with Transmission Electron Microscopy Acta Mater. 2014, 80, 159-171 10.1016/j.actamat.2014.07.062
-
(2014)
Acta Mater.
, vol.80
, pp. 159-171
-
-
Garner, A.1
Gholinia, A.2
Frankel, P.3
Gass, M.4
MacLaren, I.5
Preuss, M.6
-
30
-
-
84900415101
-
A Novel Approach for Site-Specific Atom Probe Specimen Preparation by Focused Ion Beam and Transmission Electron Backscatter Diffraction
-
Babinsky, K.; De Kloe, R.; Clemens, H.; Primig, S. A Novel Approach for Site-Specific Atom Probe Specimen Preparation by Focused Ion Beam and Transmission Electron Backscatter Diffraction Ultramicroscopy 2014, 144, 9-18 10.1016/j.ultramic.2014.04.003
-
(2014)
Ultramicroscopy
, vol.144
, pp. 9-18
-
-
Babinsky, K.1
De Kloe, R.2
Clemens, H.3
Primig, S.4
-
31
-
-
84896102513
-
Characterizing Deformed Ultrafine-Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction in a Scanning Electron Microscope
-
Trimby, P. W.; Cao, Y.; Chen, Z.; Han, S.; Hemker, K. J.; Lian, J.; Liao, X.; Rottmann, P.; Samudrala, S.; Sun, J. et al. Characterizing Deformed Ultrafine-Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction in a Scanning Electron Microscope Acta Mater. 2014, 62, 69-80 10.1016/j.actamat.2013.09.026
-
(2014)
Acta Mater.
, vol.62
, pp. 69-80
-
-
Trimby, P.W.1
Cao, Y.2
Chen, Z.3
Han, S.4
Hemker, K.J.5
Lian, J.6
Liao, X.7
Rottmann, P.8
Samudrala, S.9
Sun, J.10
-
32
-
-
84901008839
-
2 Based Superconductors
-
2 Based Superconductors Nanoscale 2014, 6, 6166-6172 10.1039/c4nr00415a
-
(2014)
Nanoscale
, vol.6
, pp. 6166-6172
-
-
Yeoh, W.K.1
Cui, X.Y.2
Gault, B.3
De Silva, K.S.B.4
Xu, X.5
Liu, H.W.6
Yen, H.W.7
Wong, D.8
Bao, P.9
Larson, D.J.10
-
33
-
-
84898680959
-
Correlative Tomography
-
Burnett, T. L.; McDonald, S. A.; Gholinia, A.; Geurts, R.; Janus, M.; Slater, T.; Haigh, S. J.; Ornek, C.; Almuaili, F.; Engelberg, D. L. Correlative Tomography Sci. Rep. 2014, 4, 4711 10.1038/srep04711
-
(2014)
Sci. Rep.
, vol.4
, pp. 4711
-
-
Burnett, T.L.1
McDonald, S.A.2
Gholinia, A.3
Geurts, R.4
Janus, M.5
Slater, T.6
Haigh, S.J.7
Ornek, C.8
Almuaili, F.9
Engelberg, D.L.10
-
34
-
-
84900632216
-
Transmission Kikuchi Diffraction in the Scanning Electron Microscope: Orientation Mapping on the Nanoscale
-
Trimby, P. W.; Cairney, J. M. Transmission Kikuchi Diffraction in the Scanning Electron Microscope: Orientation Mapping on the Nanoscale Adv. Mater. Processes 2014, 172, 13-15
-
(2014)
Adv. Mater. Processes
, vol.172
, pp. 13-15
-
-
Trimby, P.W.1
Cairney, J.M.2
-
35
-
-
84904719858
-
Specimen-Thickness Effects on Transmission Kikuchi Patterns in the Scanning Electron Microscope
-
Rice, K. P.; Keller, R. R.; Stoykovich, M. P. Specimen-Thickness Effects on Transmission Kikuchi Patterns in the Scanning Electron Microscope J. Microsc. 2014, 254, 129-136 10.1111/jmi.12124
-
(2014)
J. Microsc.
, vol.254
, pp. 129-136
-
-
Rice, K.P.1
Keller, R.R.2
Stoykovich, M.P.3
-
36
-
-
84919495915
-
Scanning Electron Microscopy and Transmitted Electron Backscatter Diffraction Examination of Asbestos Standard Reference Materials, Amphibole Particles of Differing Morphology, and Particle Phase Discrimination from Talc Ores
-
Bandli, B. R.; Gunter, M. E. Scanning Electron Microscopy and Transmitted Electron Backscatter Diffraction Examination of Asbestos Standard Reference Materials, Amphibole Particles of Differing Morphology, and Particle Phase Discrimination from Talc Ores Microsc. Microanal. 2014, 20, 1805-1816 10.1017/S1431927614013415
-
(2014)
Microsc. Microanal.
, vol.20
, pp. 1805-1816
-
-
Bandli, B.R.1
Gunter, M.E.2
-
37
-
-
84946691790
-
Application of Transmission EBSD on High Topography Surface Aluminum Thin Film
-
(EPTC), Singapore
-
Zhang, S. Y.; Zhang, Y. J.; Kwek, W. M.; Goi, L. S.; Trigg, A. D.; Tang, L. J. Application of Transmission EBSD on High Topography Surface Aluminum Thin Film. IEEE 16th Electronics Packaging Technology Conference (EPTC), Singapore 2014; pp 828-832.
-
(2014)
IEEE 16th Electronics Packaging Technology Conference
, pp. 828-832
-
-
Zhang, S.Y.1
Zhang, Y.J.2
Kwek, W.M.3
Goi, L.S.4
Trigg, A.D.5
Tang, L.J.6
-
38
-
-
84923356396
-
The Capability of Transmission Kikuchi Diffraction Technique for Characterizing Nano-Grained Oxide Scales Formed on a FeCrAl Stainless Steel
-
Mortazavi, N.; Esmaily, M.; Halvarsson, M. The Capability of Transmission Kikuchi Diffraction Technique for Characterizing Nano-Grained Oxide Scales Formed on a FeCrAl Stainless Steel Mater. Lett. 2015, 147, 42-45 10.1016/j.matlet.2015.02.008
-
(2015)
Mater. Lett.
, vol.147
, pp. 42-45
-
-
Mortazavi, N.1
Esmaily, M.2
Halvarsson, M.3
-
39
-
-
84910049147
-
Electron Imaging with an EBSD Detector
-
Wright, S. I.; Nowell, M. M.; de Kloe, R.; Camus, P.; Rampton, T. Electron Imaging with an EBSD Detector Ultramicroscopy 2015, 148, 132-145 10.1016/j.ultramic.2014.10.002
-
(2015)
Ultramicroscopy
, vol.148
, pp. 132-145
-
-
Wright, S.I.1
Nowell, M.M.2
De Kloe, R.3
Camus, P.4
Rampton, T.5
-
40
-
-
84913553944
-
Identifying Suboxide Grains at the Metal-Oxide Interface of a Corroded Zr-1.0%Nb Alloy Using (S)TEM, Transmission-EBSD and EELS
-
Hu, J.; Garner, A.; Ni, N.; Gholinia, A.; Nicholls, R. J.; Lozano-Perez, S.; Frankel, P.; Preuss, M.; Grovenor, C. R. M. Identifying Suboxide Grains at the Metal-Oxide Interface of a Corroded Zr-1.0%Nb Alloy Using (S)TEM, Transmission-EBSD and EELS Micron 2015, 69, 35-42 10.1016/j.micron.2014.10.004
-
(2015)
Micron
, vol.69
, pp. 35-42
-
-
Hu, J.1
Garner, A.2
Ni, N.3
Gholinia, A.4
Nicholls, R.J.5
Lozano-Perez, S.6
Frankel, P.7
Preuss, M.8
Grovenor, C.R.M.9
-
41
-
-
84923049185
-
Nanostructure Characterization of Flow-Formed Cr-Mo-V Steel Using Transmission Kikuchi Diffraction Technique
-
Birosca, S.; Ding, R.; Ooi, S.; Buckingham, R.; Coleman, C.; Dicks, K. Nanostructure Characterization of Flow-Formed Cr-Mo-V Steel Using Transmission Kikuchi Diffraction Technique Ultramicroscopy 2015, 153, 1-8 10.1016/j.ultramic.2015.02.001
-
(2015)
Ultramicroscopy
, vol.153
, pp. 1-8
-
-
Birosca, S.1
Ding, R.2
Ooi, S.3
Buckingham, R.4
Coleman, C.5
Dicks, K.6
-
42
-
-
84927133426
-
Transmission Kikuchi Diffraction and Transmission Electron Forescatter Imaging of Electropolished and FIB Manufactured TEM Specimens
-
Zieliński, W.; Płociński, T.; Kurzydłowski, K. J. Transmission Kikuchi Diffraction and Transmission Electron Forescatter Imaging of Electropolished and FIB Manufactured TEM Specimens Mater. Charact. 2015, 104, 42-48 10.1016/j.matchar.2015.04.003
-
(2015)
Mater. Charact.
, vol.104
, pp. 42-48
-
-
Zieliński, W.1
Płociński, T.2
Kurzydłowski, K.J.3
-
43
-
-
84924628436
-
2 Superconductors by Transmission Kikuchi Diffraction
-
2 Superconductors by Transmission Kikuchi Diffraction Scr. Mater. 2015, 101, 36-39 10.1016/j.scriptamat.2015.01.012
-
(2015)
Scr. Mater.
, vol.101
, pp. 36-39
-
-
Wong, D.C.K.1
Yeoh, W.K.2
Trimby, P.W.3
De Silva, K.S.B.4
Bao, P.5
Li, W.X.6
Xu, X.7
Dou, S.X.8
Ringer, S.P.9
Zheng, R.K.10
-
44
-
-
84891352458
-
Multiscale Phase Mapping of LiFePO4-Based Electrodes by Transmission Electron Microscopy and Electron Forward Scattering Diffraction
-
Robert, D.; Douillard, T.; Boulineau, A.; Brunetti, G.; Nowakowski, P.; Venet, D.; Bayle-Guillemaud, P.; Cayron, C. Multiscale Phase Mapping of LiFePO4-Based Electrodes by Transmission Electron Microscopy and Electron Forward Scattering Diffraction ACS Nano 2013, 7, 10887-10894 10.1021/nn4043964
-
(2013)
ACS Nano
, vol.7
, pp. 10887-10894
-
-
Robert, D.1
Douillard, T.2
Boulineau, A.3
Brunetti, G.4
Nowakowski, P.5
Venet, D.6
Bayle-Guillemaud, P.7
Cayron, C.8
-
45
-
-
0031171777
-
Advances in Crystal Orientation Mapping with the SEM and TEM
-
Schwarzer, R. A. Advances in Crystal Orientation Mapping with the SEM and TEM Ultramicroscopy 1997, 67, 19-24 10.1016/S0304-3991(97)00010-7
-
(1997)
Ultramicroscopy
, vol.67
, pp. 19-24
-
-
Schwarzer, R.A.1
-
46
-
-
0037411772
-
Polycrystal Orientation Maps from TEM
-
Fundenberger, J.-J.; Morawiec, A.; Bouzy, E.; Lecomte, J. S. Polycrystal Orientation Maps from TEM Ultramicroscopy 2003, 96, 127-137 10.1016/S0304-3991(02)00435-7
-
(2003)
Ultramicroscopy
, vol.96
, pp. 127-137
-
-
Fundenberger, J.-J.1
Morawiec, A.2
Bouzy, E.3
Lecomte, J.S.4
-
47
-
-
0042347453
-
System for Creating Orientation Maps Using TEM
-
Fundenberger, J.-J.; Morawiec, A.; Bouzy, E.; Lecomte, J. S. System for Creating Orientation Maps Using TEM Mater. Chem. Phys. 2003, 81, 535-537 10.1016/S0254-0584(03)00068-3
-
(2003)
Mater. Chem. Phys.
, vol.81
, pp. 535-537
-
-
Fundenberger, J.-J.1
Morawiec, A.2
Bouzy, E.3
Lecomte, J.S.4
-
48
-
-
57649187214
-
Development of a TEM-Based Orientation Microscopy System
-
Zaefferer, S.; Wu, G. Development of a TEM-Based Orientation Microscopy System Ceram. Trans. 2008, 201, 221-228 10.1002/9780470444214.ch24
-
(2008)
Ceram. Trans.
, vol.201
, pp. 221-228
-
-
Zaefferer, S.1
Wu, G.2
-
49
-
-
44349187530
-
Using EBSD and TEM-Kikuchi patterns to Study Local Crystallography at the Domain Boundaries of Lead Zirconate Titanate
-
Farooq, M. U.; Villaurrutia, R.; MacLaren, I.; Kungl, H.; Hoffmann, M. J.; Fundenberger, J.-J. Using EBSD and TEM-Kikuchi patterns to Study Local Crystallography at the Domain Boundaries of Lead Zirconate Titanate J. Microsc. 2008, 230, 445-454 10.1111/j.1365-2818.2008.02004.x
-
(2008)
J. Microsc.
, vol.230
, pp. 445-454
-
-
Farooq, M.U.1
Villaurrutia, R.2
MacLaren, I.3
Kungl, H.4
Hoffmann, M.J.5
Fundenberger, J.-J.6
-
50
-
-
69749119737
-
Advances in TEM Orientation Microscopy by Combination of Dark-Field Conical Scanning and Improved Image Matching
-
Wu, G.; Zaefferer, S. Advances in TEM Orientation Microscopy by Combination of Dark-Field Conical Scanning and Improved Image Matching Ultramicroscopy 2009, 109, 1317-1325 10.1016/j.ultramic.2009.06.002
-
(2009)
Ultramicroscopy
, vol.109
, pp. 1317-1325
-
-
Wu, G.1
Zaefferer, S.2
-
51
-
-
78349270168
-
TEM Orientation Imaging in Characterization of Texture Changes in FCC Metals
-
Paul, H. TEM Orientation Imaging in Characterization of Texture Changes in FCC Metals Adv. Eng. Mater. 2010, 12, 1029-1036 10.1002/adem.201000078
-
(2010)
Adv. Eng. Mater.
, vol.12
, pp. 1029-1036
-
-
Paul, H.1
-
52
-
-
79955412420
-
Advance in Orientation Microscopy: Quantitative Analysis of Nanocrystalline Structures
-
Seyring, M.; Song, X.; Rettenmayr, M. Advance in Orientation Microscopy: Quantitative Analysis of Nanocrystalline Structures ACS Nano 2011, 5, 2580-2586 10.1021/nn1023126
-
(2011)
ACS Nano
, vol.5
, pp. 2580-2586
-
-
Seyring, M.1
Song, X.2
Rettenmayr, M.3
-
53
-
-
79958007019
-
A Critical Review of Orientation Microscopy in SEM and TEM
-
Zaefferer, S. A Critical Review of Orientation Microscopy in SEM and TEM Cryst. Res. Technol. 2011, 46, 607-628 10.1002/crat.201100125
-
(2011)
Cryst. Res. Technol.
, vol.46
, pp. 607-628
-
-
Zaefferer, S.1
-
54
-
-
84859012991
-
Investigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope
-
Bieda, M. Investigations of Fine Grained Metallic Materials by Means of Orientation Maps in Transmission Electron Microscope Solid State Phenom. 2012, 186, 53-57 10.4028/www.scientific.net/SSP.186.53
-
(2012)
Solid State Phenom.
, vol.186
, pp. 53-57
-
-
Bieda, M.1
-
55
-
-
84883799278
-
Orientation and Phase Mapping in the Transmission Electron Microscope Using Precession-Assisted Diffraction Spot Recognition: State-of-the-Art Results
-
Viladot, D.; Véron, M.; Gemmi, M.; Peiró, F.; Portillo, J.; Estradé, S.; Mendoza, J.; Llorca-Isern, N.; Nicolopoulos, S. Orientation and Phase Mapping in the Transmission Electron Microscope Using Precession-Assisted Diffraction Spot Recognition: State-of-the-Art Results J. Microsc. 2013, 252, 23-34 10.1111/jmi.12065
-
(2013)
J. Microsc.
, vol.252
, pp. 23-34
-
-
Viladot, D.1
Véron, M.2
Gemmi, M.3
Peiró, F.4
Portillo, J.5
Estradé, S.6
Mendoza, J.7
Llorca-Isern, N.8
Nicolopoulos, S.9
-
56
-
-
84884360391
-
Orientation Precision of TEM-Based Orientation Mapping Techniques
-
Morawiec, A.; Bouzy, E.; Paul, H.; Fundenberger, J.-J. Orientation Precision of TEM-Based Orientation Mapping Techniques Ultramicroscopy 2014, 136, 107-118 10.1016/j.ultramic.2013.08.008
-
(2014)
Ultramicroscopy
, vol.136
, pp. 107-118
-
-
Morawiec, A.1
Bouzy, E.2
Paul, H.3
Fundenberger, J.-J.4
-
57
-
-
84906822655
-
Automated Crystal Orientation and Phase Mapping in TEM
-
Rauch, E. F.; Véron, M. Automated Crystal Orientation and Phase Mapping in TEM Mater. Charact. 2014, 98, 1-9 10.1016/j.matchar.2014.08.010
-
(2014)
Mater. Charact.
, vol.98
, pp. 1-9
-
-
Rauch, E.F.1
Véron, M.2
-
58
-
-
84919494836
-
Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques
-
Bocker, C.; Kracker, M.; Rüssel, C. Replica Extraction Method on Nanostructured Gold Coatings and Orientation Determination Combining SEM and TEM Techniques Microsc. Microanal. 2014, 20, 1654-1661 10.1017/S1431927614013336
-
(2014)
Microsc. Microanal.
, vol.20
, pp. 1654-1661
-
-
Bocker, C.1
Kracker, M.2
Rüssel, C.3
-
59
-
-
84923023808
-
Estimation of Dislocation Density from Precession Electron Diffraction Data Using the Nye Tensor
-
Leff, A. C.; Weinberger, C. R.; Taheri, M. L. Estimation of Dislocation Density from Precession Electron Diffraction Data Using the Nye Tensor Ultramicroscopy 2015, 153, 9-21 10.1016/j.ultramic.2015.02.002
-
(2015)
Ultramicroscopy
, vol.153
, pp. 9-21
-
-
Leff, A.C.1
Weinberger, C.R.2
Taheri, M.L.3
-
60
-
-
84923367338
-
Combining Structural and Chemical Information at the Nanometer Scale by Correlative Transmission Electron Microscopy and Atom Probe Tomography
-
Herbig, M.; Choi, P.; Raabe, D. Combining Structural and Chemical Information at the Nanometer Scale by Correlative Transmission Electron Microscopy and Atom Probe Tomography Ultramicroscopy 2015, 153, 32-39 10.1016/j.ultramic.2015.02.003
-
(2015)
Ultramicroscopy
, vol.153
, pp. 32-39
-
-
Herbig, M.1
Choi, P.2
Raabe, D.3
-
61
-
-
84916898862
-
Simultaneous Orientation and Thickness Mapping in Transmission Electron Microscopy
-
Tyutyunnikov, D.; Özdöl, V. B.; Koch, C. T. Simultaneous Orientation and Thickness Mapping in Transmission Electron Microscopy Ultramicroscopy 2015, 150, 37-43 10.1016/j.ultramic.2014.11.034
-
(2015)
Ultramicroscopy
, vol.150
, pp. 37-43
-
-
Tyutyunnikov, D.1
Özdöl, V.B.2
Koch, C.T.3
-
62
-
-
84935842135
-
Cu/Ti Multilayered Composite Fabricated by Accumulative Roll-Bonding Process
-
Hosseini, M.; Danesh-Manesh, H.; Abbasi, M.; Kim, D. I. Cu/Ti Multilayered Composite Fabricated by Accumulative Roll-Bonding Process. Mater. Des. 2015, 81, 122-132.
-
(2015)
Mater. Des.
, vol.81
, pp. 122-132
-
-
Hosseini, M.1
Danesh-Manesh, H.2
Abbasi, M.3
Kim, D.I.4
-
63
-
-
84946213926
-
Effects of Alloyed Aluminum and Titanium on the Oxidation Behavior of INCONEL 740 Superalloy
-
Accepted for publication
-
Abbasi, M.; Kim, D. I.; Shim, J. H.; Jung, W. S. Effects of Alloyed Aluminum and Titanium on the Oxidation Behavior of INCONEL 740 Superalloy. J. Alloys Compd. Accepted for publication, DOI: 10.1016/j.jallcom.2015.10.198.
-
J. Alloys Compd.
-
-
Abbasi, M.1
Kim, D.I.2
Shim, J.H.3
Jung, W.S.4
-
64
-
-
84903778889
-
Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries
-
Wright, S. I.; Nowell, M. M.; de Kloe, R.; Chan, L. Orientation Precision of Electron Backscatter Diffraction Measurements Near Grain Boundaries Microsc. Microanal. 2014, 20, 852-863 10.1017/S143192761400035X
-
(2014)
Microsc. Microanal.
, vol.20
, pp. 852-863
-
-
Wright, S.I.1
Nowell, M.M.2
De Kloe, R.3
Chan, L.4
-
65
-
-
84903706740
-
Five-Parameter Grain Boundary Inclination Recovery with EBSD and Interaction Volume Models
-
Sorensen, C.; Basinger, J. A.; Nowell, M. M.; Fullwood, D. T. Five-Parameter Grain Boundary Inclination Recovery with EBSD and Interaction Volume Models Metall. Mater. Trans. A 2014, 45, 4165-4172 10.1007/s11661-014-2345-7
-
(2014)
Metall. Mater. Trans. A
, vol.45
, pp. 4165-4172
-
-
Sorensen, C.1
Basinger, J.A.2
Nowell, M.M.3
Fullwood, D.T.4
-
66
-
-
84903999419
-
EBSD and Reconstruction of Pre-Transformation Microstructures, Examples and Complexities in Steels
-
Abbasi, M.; Kim, D. I.; Nelson, T. W.; Abbasi, M. EBSD and Reconstruction of Pre-Transformation Microstructures, Examples and Complexities in Steels Mater. Charact. 2014, 95, 219-231 10.1016/j.matchar.2014.06.023
-
(2014)
Mater. Charact.
, vol.95
, pp. 219-231
-
-
Abbasi, M.1
Kim, D.I.2
Nelson, T.W.3
Abbasi, M.4
-
67
-
-
62649121435
-
Determination of Crystal Phase from an Electron Backscatter Diffraction Pattern
-
Dingley, D. J.; Wright, S. I. Determination of Crystal Phase from an Electron Backscatter Diffraction Pattern J. Appl. Crystallogr. 2009, 42, 234-241 10.1107/S0021889809001654
-
(2009)
J. Appl. Crystallogr.
, vol.42
, pp. 234-241
-
-
Dingley, D.J.1
Wright, S.I.2
-
69
-
-
43049178215
-
3 Thin Films Effect of Crystallization on Growth and Properties
-
3 Thin Films Effect of Crystallization on Growth and Properties Appl. Surf. Sci. 2008, 254, 5149-5156 10.1016/j.apsusc.2008.02.016
-
(2008)
Appl. Surf. Sci.
, vol.254
, pp. 5149-5156
-
-
Tarre, A.1
Aarik, J.2
Mändar, H.3
Niilisk, A.4
Pärna5
Rammula, R.6
Uustare, T.7
Rosental, A.8
Sammelselg, V.9
-
70
-
-
84872737968
-
Crystallinity of Inorganic Films Grown by Atomic Layer Deposition Overview and General Trends
-
Miikkulainen, V.; Leskelä, M.; Ritala, M.; Puurunen, R. L. Crystallinity of Inorganic Films Grown by Atomic Layer Deposition Overview and General Trends J. Appl. Phys. 2013, 113, 021301 10.1063/1.4757907
-
(2013)
J. Appl. Phys.
, vol.113
, pp. 021301
-
-
Miikkulainen, V.1
Leskelä, M.2
Ritala, M.3
Puurunen, R.L.4
-
71
-
-
84948470906
-
-
Fifth Bruker EBSD Workshop, May 11, 2015, Seoul, Republic of Korea (unpublished work).
-
Goran, D. Fifth Bruker EBSD Workshop, May 11, 2015, Seoul, Republic of Korea (unpublished work).
-
-
-
Goran, D.1
|