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Volumn 172, Issue 2, 2014, Pages 13-15

Transmission kikuchi diffraction in the scanning electron microscope: Orientation mapping on the nanoscale

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BACK SCATTER DIFFRACTION; FEG-SEM; ION-BEAM MILLING; NANO SCALE; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; ORIENTATION MAPPING; TEM SAMPLE PREPARATION; UNIVERSITY OF SYDNEY;

EID: 84900632216     PISSN: 08827958     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (8)
  • 8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.