|
Volumn 172, Issue 2, 2014, Pages 13-15
|
Transmission kikuchi diffraction in the scanning electron microscope: Orientation mapping on the nanoscale
a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRON BACK SCATTER DIFFRACTION;
FEG-SEM;
ION-BEAM MILLING;
NANO SCALE;
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY;
ORIENTATION MAPPING;
TEM SAMPLE PREPARATION;
UNIVERSITY OF SYDNEY;
ELECTROLYTIC POLISHING;
MAPPING;
NANOTECHNOLOGY;
RESEARCH;
SCANNING ELECTRON MICROSCOPY;
DIFFRACTION;
|
EID: 84900632216
PISSN: 08827958
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (6)
|
References (8)
|