How effective are compression codes for reducing test data volume?

Proceedings of the IEEE VLSI Test Symposium

Volumn 2002-January, Issue , 2002, Pages 91-96

  Chandra, A ^a   Chakrabarty, K ^a   Medina, R A ^b  

^a Duke University   (United States)

^b Massachusetts Institute of Technology   (United States)

Author keywords

Automatic testing; Circuit testing; Computer science; Decoding; Entropy; Hip; Performance analysis; System testing; System on a chip; Test data compression

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; AUTOMATIC TESTING; CODES (SYMBOLS); COMPUTER SCIENCE; COMPUTER TESTING; DECODING; ELECTRIC NETWORK ANALYSIS; ENTROPY; HOT ISOSTATIC PRESSING; INTEGRATED CIRCUIT TESTING; PROGRAMMABLE LOGIC CONTROLLERS; SYSTEM-ON-CHIP; VLSI CIRCUITS;

CIRCUIT TESTING; PERFORMANCE ANALYSIS; SYSTEM ON A CHIP; SYSTEM TESTING; TEST DATA COMPRESSION;

DATA COMPRESSION;

EID: 84948439267     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011117     Document Type: Conference Paper

References (11)

1. Y. Zorian, "Testing the monster chip", IEEE Spectrum, vol. 36, issue 7, pp. 54-70, July 1999.
2. A. Chandra and K. Chakrabarty, "Test resource partitioning for SOCs", IEEE Design & Test of Computers, vol. 18, pp. 80-91, September-October 2001.
3. A. Jas and N. A. Touba, "Test vector decompression via cyclical scan chains and its application to testing core-based designs", Proc. International Test Conference, pp. 458-464, 1998.
4. A. Chandra and K. Chakrabarty, "System-on-a-chip test data compression and decompression architectures based on Golomb codes", IEEE Trans. CAD, vol. 20, no. 3, pp. 355-368, March 2001.
5. A. Chandra and K. Chakrabarty, "Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding", Proc. DATE Conf., pp. 145-149, 2001.
6. A. Chandra and K. Chakrabarty, "Frequency-directed run-length (FDR) codes with application to system-on-a-chip test data compression", Proc. IEEE VLSI Test Symposium, pp. 42-47, 2001.
7. S. W. Golomb, "Run-length encoding", IEEE Transactions on Information Theory, vol. IT-12, pp. 399-401, 1966.
8. H. Kobayashi and L. R. Bahl, "Image data compression by predictive coding, Part I: Prediction Algorithm", IBM Journal of Research and Development, vol. 18, pp. 164, 1974.
9. J. A. Storer, Data Compression: Methods and Theory, Computer Science Press, Rockville, MD, 1988.
10. A. Khoche and J. Rivoir, "I/O Bandwidth Bottleneck for Test: Is it Real?", Proc. Test Resource Partitioning Workshop, pp. 2.3-1-2.3-6, 2000.
11. I. Hamzaoglu and J. H. Patel, "Test set compaction algorithms for combinational circuits", Proc. International Conference on CAD, pp. 283-289, 1998.