Phase contrast STEM for thin samples: Integrated differential phase contrast

Ultramicroscopy

Volumn 160, Issue , 2016, Pages 265-280

  Lazić, Ivan ^a   Bosch, Eric G T ^a   Lazar, Sorin ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

Differential phase contrast; Integrated differential phase contrast; Scanning transmission electron microscopy

Indexed keywords

CHEMICAL ELEMENTS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; LANTHANUM COMPOUNDS; PHASE SHIFT; PHASE SHIFTERS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; CONTRAST TRANSFER FUNCTION; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); DIFFERENTIAL PHASE CONTRAST; ELECTRICAL FIELD; ELECTROSTATIC POTENTIALS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TWO-DIMENSIONAL INTEGRATIONS;

SIGNAL TO NOISE RATIO;

ARTICLE; CENTER OF MASS; CONTRAST TRANSFER FUNCTION; ELECTRIC FIELD; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGING AND DISPLAY; INTEGRATED DIFFERENTIAL PHASE CONTRAST; MATHEMATICAL MODEL; PHASE CONTRAST MICROSCOPY; PHYSICAL PARAMETERS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; STATIC ELECTRICITY;

EID: 84946917548     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2015.10.011     Document Type: Article

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