Determination of High-Frequency Dielectric Constant and Surface Potential of Graphene Oxide and Influence of Humidity by Kelvin Probe Force Microscopy

Langmuir

Volumn 31, Issue 41, 2015, Pages 11339-11343

  Salomão, Francisco C ^a   Lanzoni, Evandro M ^b   Costa, Carlos A ^b   Deneke, Christoph ^b   Barros, Eduardo B ^a  

^a FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

^b BRAZILIAN CENTER FOR RESEARCH IN ENERGY AND MATERIALS CNPEM   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

HUMIDITY CONTROL;

CAPACITANCE COUPLING; CONTROLLED ENVIRONMENT; GRAPHENE OXIDES; HIGH FREQUENCY HF; HIGH-FREQUENCY DIELECTRICS; INFLUENCE OF HUMIDITY; KELVIN PROBE FORCE MICROSCOPY;

GRAPHENE;

EID: 84945588773     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/acs.langmuir.5b01786     Document Type: Article

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