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Volumn 2003-January, Issue , 2003, Pages

ESD protection design for giga-Hz RF CMOS LNA with novel impedance-isolation technique

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; FREQUENCY BANDS; INTEGRATED CIRCUIT DESIGN; NOISE FIGURE; RADIO FREQUENCY AMPLIFIERS;

EID: 84945219086     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (19)
  • 1
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    • ESD protection design for CMOS RF integrated circuits
    • M.-D. Ker, T.-Y. Chen, and C.-Y. Chang, "ESD protection design for CMOS RF integrated circuits," in Proc. of EOS/ESD Symp., 2001, pp. 346-354.
    • (2001) Proc. of EOS/ESD Symp. , pp. 346-354
    • Ker, M.-D.1    Chen, T.-Y.2    Chang, C.-Y.3
  • 2
    • 0036603739 scopus 로고    scopus 로고
    • ESD protection design for CMOS RF integrated circuits using polysilicon diodes
    • M.-D. Ker and C.-Y. Chang, "ESD protection design for CMOS RF integrated circuits using polysilicon diodes," Microelectronics Reliability, vol. 42, pp. 863-872, 2002.
    • (2002) Microelectronics Reliability , vol.42 , pp. 863-872
    • Ker, M.-D.1    Chang, C.-Y.2
  • 3
    • 0011159445 scopus 로고
    • Process and design optimization for advanced CMOS I/O ESD protection devices
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    • (1990) Proc. of EOS/ESD Symp. , pp. 206-213
    • Daniel, S.1    Krieger, G.2
  • 4
    • 0002131374 scopus 로고    scopus 로고
    • Methodology for layout design and optimization of ESD protection transistors
    • S. G. Deebe, "Methodology for layout design and optimization of ESD protection transistors," in Proc. of EOS/ESD Symp., 1996, pp. 265-275.
    • (1996) Proc. of EOS/ESD Symp. , pp. 265-275
    • Deebe, S.G.1
  • 5
    • 0026838967 scopus 로고
    • Dynamic gate coupling of nMOS for efficient output ESD protection
    • C. Duvvury and C. Diaz, "Dynamic gate coupling of nMOS for efficient output ESD protection," in Proc. IRPS, 1992, pp. 141-150.
    • (1992) Proc. IRPS , pp. 141-150
    • Duvvury, C.1    Diaz, C.2
  • 6
    • 0030242764 scopus 로고    scopus 로고
    • Capacitor-couple ESD protection circuit for deep-submicron low-voltage CMOS ASIC
    • Sept.
    • M.-D. Ker, C.-Y. Wu, T. Cheng, and H.-H. Chang, "Capacitor-couple ESD protection circuit for deep-submicron low-voltage CMOS ASIC," IEEE Trans. VLSI Systems., vol. 4, pp. 307-321, Sept. 1996.
    • (1996) IEEE Trans. VLSI Systems. , vol.4 , pp. 307-321
    • Ker, M.-D.1    Wu, C.-Y.2    Cheng, T.3    Chang, H.-H.4
  • 7
    • 0031641250 scopus 로고    scopus 로고
    • Novel input ESD protection circuit with substrate-triggering technique in a 0.25-um shallow-trench-isolation CMOS technology
    • M.-D. Ker, T.-Y. Chen, C.-Y. Wu, H. Tang, K.-C. Su, and S.-W. Sun, "Novel input ESD protection circuit with substrate-triggering technique in a 0.25-um shallow-trench-isolation CMOS technology," in Proc. IEEE Int. Symp. Circuits and Systems, 1998, pp. 212-215.
    • (1998) Proc. IEEE Int. Symp. Circuits and Systems , pp. 212-215
    • Ker, M.-D.1    Chen, T.-Y.2    Wu, C.-Y.3    Tang, H.4    Su, K.-C.5    Sun, S.-W.6
  • 9
    • 0038494679 scopus 로고    scopus 로고
    • Substrate-triggered technique for on-chip ESD protection design in a 0.18-m salicided CMOS process
    • in press
    • M.-D. Ker and T.-Y. Chen, "Substrate-triggered technique for on-chip ESD protection design in a 0.18-m salicided CMOS process," IEEE Trans. on Electron Devices, in press, 2003.
    • (2003) IEEE Trans. on Electron Devices
    • Ker, M.-D.1    Chen, T.-Y.2
  • 10
    • 0032273088 scopus 로고    scopus 로고
    • Electrostatic discharge protection circuits in CMOS IC' s using the lateral SCR devices: An overview
    • M.-D. Ker, "Electrostatic discharge protection circuits in CMOS IC' s using the lateral SCR devices: an overview," in Proc. of IEEE Int. Conf. on Electronics, Circuits and Systems, 1998, pp. 325-328.
    • (1998) Proc. of IEEE Int. Conf. on Electronics, Circuits and Systems , pp. 325-328
    • Ker, M.-D.1
  • 11
    • 0038394728 scopus 로고    scopus 로고
    • Substrate-triggered SCR device for on-chip ESD protection in fully silicided sub-quarter-micron CMOS process
    • Feb.
    • M.-D. Ker and K.-C. Hsu, "Substrate-triggered SCR device for on-chip ESD protection in fully silicided sub-quarter-micron CMOS process," IEEE Trans. on Electron Devices, vol. 50, no.2, pp. 397-405, Feb. 2003.
    • (2003) IEEE Trans. on Electron Devices , vol.50 , Issue.2 , pp. 397-405
    • Ker, M.-D.1    Hsu, K.-C.2
  • 12
    • 0034543814 scopus 로고    scopus 로고
    • Investigation on different ESD protection strategies devoted to 3.3V RF applications (2 Ghz) in a 0.18m CMOS process
    • C. Richier, P. Salome, G. Mabboux, I. Zaza, A. Juge, and P. Mortini, "Investigation on different ESD protection strategies devoted to 3.3V RF applications (2 Ghz) in a 0.18m CMOS process," in Proc. of EOS/ESD Symp., 2000, pp. 251-259.
    • (2000) Proc. of EOS/ESD Symp. , pp. 251-259
    • Richier, C.1    Salome, P.2    Mabboux, G.3    Zaza, I.4    Juge, A.5    Mortini, P.6
  • 13
    • 0003380325 scopus 로고    scopus 로고
    • Diode network used as ESD protection in RF applications
    • R. Velghe, P. Vreede, and P. Woerlee, "Diode network used as ESD protection in RF applications," in Proc. of EOS/ESD Symp., 2001, pp. 337-345.
    • (2001) Proc. of EOS/ESD Symp. , pp. 337-345
    • Velghe, R.1    Vreede, P.2    Woerlee, P.3
  • 16
    • 0036316886 scopus 로고    scopus 로고
    • ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness
    • M.-D. Ker, W.-Y. Lo, C.-M. Lee, C.-P. Chen, and H.-S. Kao, "ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness," in Dig. of IEEE RFIC Symp., 2002, pp. 427-430.
    • (2002) Dig. of IEEE RFIC Symp. , pp. 427-430
    • Ker, M.-D.1    Lo, W.-Y.2    Lee, C.-M.3    Chen, C.-P.4    Kao, H.-S.5
  • 17
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    • Cancellation technique to provide ESD protection for multi-GHz RF inputs
    • Feb.
    • S. Hyvonen, S. Joshi, and E. Rosenbaum, "Cancellation technique to provide ESD protection for multi-GHz RF inputs," Electronics Letters, vol. 39, pp. 284-286, Feb. 2003.
    • (2003) Electronics Letters , vol.39 , pp. 284-286
    • Hyvonen, S.1    Joshi, S.2    Rosenbaum, E.3
  • 18
  • 19
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    • Investigation on RF performance of diodes for ESD protection in giga-Hz RF circuits
    • C.-M. Lee and M.-D. Ker, "Investigation on RF performance of diodes for ESD protection in giga-Hz RF circuits," in Proc. of Taiwan ESD Conf., 2002, pp. 45-50.
    • (2002) Proc. of Taiwan ESD Conf. , pp. 45-50
    • Lee, C.-M.1    Ker, M.-D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.