Redox Titrations via Surface Interrogation Scanning Electrochemical Microscopy at an Extended Semiconducting Surface for the Quantification of Photogenerated Adsorbed Intermediates

Electrochimica Acta

Volumn 179, Issue , 2015, Pages 74-83

  Simpson, Burton H ^a   Rodríguez López, Joaquín ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

intermediate; SECM; semiconductor; surface coverage; water splitting

Indexed keywords

DOPING (ADDITIVES); ELECTROCHEMICAL ELECTRODES; ELECTRODES; NANOTECHNOLOGY; REACTION INTERMEDIATES; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SEMICONDUCTOR MATERIALS; SURFACE REACTIONS; TRANSIENTS;

ELECTROCHEMICAL SIMULATION; EXPERIMENTAL DEMONSTRATIONS; INTERMEDIATE; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM; SEMICONDUCTING SURFACES; SURFACE COVERAGES; WATER SPLITTING;

ANALYTIC EQUIPMENT;

EID: 84943453835     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2015.04.128     Document Type: Article

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