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Volumn 4, Issue 15, 2002, Pages 3814-3819
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Scanning electrochemical microscopy (SECM) feedback approach for measuring lateral proton diffusion in langmuir monolayers: Theory and application
a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ACID;
BASE;
HYDROGEN;
PROTON;
AIR;
ARTICLE;
DIFFUSION;
DIFFUSION COEFFICIENT;
MATHEMATICAL MODEL;
MICROELECTRODE;
PROTON TRANSPORT;
REDUCTION;
SCANNING ELECTRON MICROSCOPY;
SURFACE PROPERTY;
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EID: 0036378398
PISSN: 14639076
EISSN: None
Source Type: Journal
DOI: 10.1039/b111399b Document Type: Article |
Times cited : (32)
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References (49)
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