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Volumn 4, Issue 15, 2002, Pages 3814-3819

Scanning electrochemical microscopy (SECM) feedback approach for measuring lateral proton diffusion in langmuir monolayers: Theory and application

Author keywords

[No Author keywords available]

Indexed keywords

ACID; BASE; HYDROGEN; PROTON;

EID: 0036378398     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/b111399b     Document Type: Article
Times cited : (32)

References (49)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.