Principle and application of low energy inverse photoemission spectroscopy: A new method for measuring unoccupied states of organic semiconductors

Journal of Electron Spectroscopy and Related Phenomena

Volumn 204, Issue , 2015, Pages 116-124

  Yoshida, Hiroyuki ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

Electron affinity; Low energy inverse photoemission spectroscopy; Organic semiconductor; Unoccupied state

Indexed keywords

DAMAGE DETECTION; ELECTRON AFFINITY; ELECTRONS; KINETIC ENERGY; KINETICS; PHOTOELECTRON SPECTROSCOPY; PHOTONS; SEMICONDUCTING ORGANIC COMPOUNDS; STRONTIUM COMPOUNDS;

DAMAGE THRESHOLD; EXPERIMENTAL METHODS; INVERSE PHOTOEMISSION SPECTROSCOPY; NEAR ULTRAVIOLET; NEW EXPERIMENTAL METHOD; ORGANIC MOLECULES; PHOTON DETECTOR; UNOCCUPIED STATE;

INVERSE PROBLEMS;

EID: 84942506085     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2015.07.003     Document Type: Article

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