Low-energy inverse photoemission spectroscopy using a high-resolution grating spectrometer in the near ultraviolet range

Review of Scientific Instruments

Volumn 84, Issue 10, 2013, Pages

  Yoshida, Hiroyuki ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY RESOLUTIONS; GRATING SPECTROMETERS; INCIDENT ELECTRONS; INVERSE PHOTOEMISSION SPECTROSCOPY; SIGNAL INTENSITIES; TUNABLE PHOTON ENERGIES; VACUUM ULTRAVIOLETS; WAVELENGTH RANGES;

KINETICS; PHOTONS;

SPECTROMETERS;

EID: 84887354700     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4822119     Document Type: Article

References (38)

1. P. D. Johnson and S. L. Hulbert, Rev. Sci. Instrum. 61, 2277 (1990). 10.1063/1.1141352
2. J. C. Fuggle and J. E. Inglesfield, Top. Appl. Phys. 69, 1 (1992). 10.1007/3540541624-11
3. J. B. Pendry, Phys. Rev. Lett. 45, 1356 (1980). 10.1103/PhysRevLett.45. 1356
4. J. B. Pendry, J. Phys. C 14, 1381 (1981). 10.1088/0022-3719/14/9/022
5. P. D. Johnson and J. W. Davenport, Phys. Rev. B 31, 7521 (1985). 10.1103/PhysRevB.31.7521
6. V. Dose, Appl. Phys. 14, 117-118 (1977). 10.1007/BF00882639
7. G. Denninger, V. Dose, and H. Scheidt, Appl. Phys. 18, 375 (1979). 10.1007/BF00899691
8. V. Dose, Prog. Surf. Sci. 13, 225 (1983). 10.1016/0079-6816(83)90005-9
9. V. Dose, Appl. Surf. Sci. 22-23, 338 (1985). 10.1016/0169-4332(85)90066-2
10. D. Funnemann and H. Merz, J. Phys. E 19, 554 (1986). 10.1088/0022-3735/ 19/7/011
11. J. A. Lipton-Duffin, A. G. Mark, and A. B. McLean, Rev. Sci. Instrum. 73, 3149 (2002). 10.1063/1.1499536
12. J. A. Lipton-Duffin, A. G. Mark, G. K. Mullins, G. E. Contant, and A. B. McLean, Rev. Sci. Instrum. 75, 445 (2004). 10.1063/1.1637435
13. S. Banik, A. K. Shukla, and S. R. Barman, Rev. Sci. Instrum. 76, 066102 (2005). 10.1063/1.1921507
14. R. Stiepel, R. Ostendorf, C. Benesch, and H. Zacharias, Rev. Sci. Instrum. 76, 063109 (2005). 10.1063/1.1928192
15. M. Budke, V. Renken, H. Liebl, G. Rangelov, and M. Donath, Rev. Sci. Instrum. 78, 083903 (2007). 10.1063/1.2771096
16. M. Maniraj, S. W. D'Souza, J. Nayak, A. Rai, S. Singh, B. N. R. Sekhar, and S. R. Barman, Rev. Sci. Instrum. 82, 093901 (2011). 10.1063/1.3630948
17. M. Maniraj, B. N. R. Sekhar, and S. R. Barman, Rev. Sci. Instrum. 83, 046107 (2012). 10.1063/1.4704374
18. N. Babbe, W. Drube, I. Schafer, and M. Skibowski, J. Phys. E 18, 158 (1985). 10.1088/0022-3735/18/2/014
19. W. Sheils, R. C. G. Leckey, and J. D. Riley, Rev. Sci. Instrum. 64, 1194 (1993). 10.1063/1.1144117
20. K. Yokoyama, K. Nishihara, K. Mimura, Y. Hari, M. Taniguchi, Y. Ueda, and M. Fujisawa, Rev. Sci. Instrum. 64, 87 (1993). 10.1063/1.1144407
21. H. Namatame, M. Tamura, M. Nakatake, H. Sato, Y. Ueda, M. Taniguchi, and M. Fujisawa, J. Electron Spectrosc. Relat. Phenom. 80, 393 (1996). 10.1016/0368-2048(96)03000-9
22. F. Schedin, G. Thornton, and R. I. G. Uhrberg, Rev. Sci. Instrum. 68, 41 (1997). 10.1063/1.1147844
23. I. G. Hill and A. B. McLean, Rev. Sci. Instrum. 69, 261 (1998). 10.1063/1.1148506
24. G. Chauvet and R. Baptist, J. Electron Spectrosc. Relat. Phenom. 24, 255 (1981). 10.1016/0368-2048(81)80012-6
25. T. Fauster, F. J. Himpsel, J. J. Donelon, and A. Marx, Rev. Sci. Instrum. 54, 68 (1983). 10.1063/1.1137218
26. T. Fauster, D. Straub, J. J. Donelon, D. Grimm, A. Marx, and F. J. Himpsel, Rev. Sci. Instrum. 56, 1212 (1985). 10.1063/1.1137977
27. P. T. Andrews, Vacuum 38, 257 (1988). 10.1016/0042-207X(88)90056-5
28. M. Sancrotti, L. Braicovich, C. Chemelli, F. Ciccacci, E. Puppin, G. Trezzi, and E. Vescovo, Rev. Sci. Instrum. 62, 639 (1991). 10.1063/1.1142062
29. P. D. Johnson, S. L. Hulbert, R. F. Garrett, and M. R. Howells, Rev. Sci. Instrum. 57, 1324 (1986). 10.1063/1.1138596
30. Y. Gao, M. Grioni, B. Smandek, J. H. Weaver, and T. Tyrie, J. Phys. E 21, 489 (1988). 10.1088/0022-3735/21/5/014
31. T. E. Ollonqvist and I. J. Vayrynen, Vacuum 46, 1177 (1995). 10.1016/0042-207X(95)00135-2
32. L. Kipp, M. Boehme, H. Carstensen, R. Claessen, and M. Skibowski, Rev. Sci. Instrum. 68, 2144 (1997). 10.1063/1.1148077
33. G. Hass and R. Tousey, J. Opt. Soc. Am. 49, 593 (1959). 10.1364/JOSA.49.000593
34. H. Yoshida, Chem. Phys. Lett. 539-540, 180 (2012). 10.1016/j.cplett.2012. 04.058
35. J. H. Moore, C. C. Davis, M. A. Coplan, and S. C. Greer, Building Scientific Apparatus, 4th ed. (Cambridge University Press, New York, 2009), Chap. 4.3.
36. B. Boudaiffa, P. Cloutier, D. Hunting, M. A. Huels, and L. Sanche, Science 287, 1658 (2000). 10.1126/science.287.5458.1658
37. P. W. Erdman and E. C. Zipf, Rev. Sci. Instrum. 53, 225 (1982). 10.1063/1.1136932
38. -/count. Here, we assume the lowest values to estimate the lower limit of the LEIPES intensity. The quantum efficiency of the UVB-type CCD detector between 200 and 380 nm is 33% which is about 2 factors larger than the CsI coated microchannel plate (Ref.).