Note: Low energy inverse photoemission spectroscopy apparatus

Review of Scientific Instruments

Volumn 85, Issue 1, 2014, Pages

  Yoshida, Hiroyuki ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EMITTED PHOTONS; INVERSE PHOTOEMISSION SPECTROSCOPY; LOW ENERGY ELECTRONS; NEAR ULTRAVIOLET; SOLID MATERIAL; UNOCCUPIED STATE;

EQUIPMENT; INSTRUMENTS;

KINETICS;

EID: 84893427543     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4860055     Document Type: Article

References (24)

1. P. D. Johnson and S. L. Hulbert, Rev. Sci. Instrum. 61, 2277 (1990). 10.1063/1.1141352
2. J. C. Fuggle and J. E. Inglesfield, Top. Appl. Phys. 69, 1 (1992). 10.1007/3-540-54162-4
3. J. B. Pendry, Phys. Rev. Lett. 45, 1356 (1980). 10.1103/PhysRevLett.45. 1356
4. J. B. Pendry, J. Phys. C: Solid State Phys. 14, 1381 (1981). 10.1088/0022-3719/14/9/022
5. V. Dose, Appl. Phys. 14, 117 (1977). 10.1007/BF00882639
6. N. Babbe, W. Drube, I. Schafer, and M. Skibowski, J. Phys. E 18, 158 (1985). 10.1088/0022-3735/18/2/014
7. V. Dose, T. Fauster, and R. Schneider, Appl. Phys. A 40, 203 (1986). 10.1007/BF00616595
8. D. Funnemann and H. Merz, J. Phys. E 19, 554 (1986). 10.1088/0022-3735/ 19/7/011
9. K. Yokoyama, K. Nishihara, K. Mimura, Y. Hari, M. Taniguchi, Y. Ueda, and M. Fujisawa, Rev. Sci. Instrum. 64, 87 (1993). 10.1063/1.1144407
10. F. Schedin, G. Thornton, and R. I. G. Uhrberg, Rev. Sci. Instrum. 68, 41 (1997). 10.1063/1.1147844
11. J. A. Lipton-Duffin, A. G. Mark, and A. B. McLean, Rev. Sci. Instrum. 73, 3149 (2002). 10.1063/1.1499536
12. M. Budke, V. Renken, H. Liebl, G. Rangelov, and M. Donath, Rev. Sci. Instrum. 78, 083903 (2007). 10.1063/1.2771096
13. R. Stiepel, R. Ostendorf, C. Benesch, and H. Zacharias, Rev. Sci. Instrum. 76, 063109 (2005). 10.1063/1.1928192
14. M. Maniraj, S. W. D'Souza, J. Nayak, A. Rai, S. Singh, B. N. R. Sekhar, and S. R. Barman, Rev. Sci. Instrum. 82, 093901 (2011). 10.1063/1.3630948
15. M. Maniraj, B. N. R. Sekhar, and S. R. Barman, Rev. Sci. Instrum. 83, 046107 (2012). 10.1063/1.4704374
16. K. Tsutsumi, H. Yoshida, and N. Sato, Chem. Phys. Lett. 361, 367 (2002). 10.1016/S0009-2614(02)00990-9
17. H. Yoshida, Chem. Phys. Lett. 539-540, 180 (2012). 10.1016/j.cplett.2012. 04.058
18. H. Yoshida, Rev. Sci. Instrum. 84, 103901 (2013). 10.1063/1.4822119
19. B. Boudaiffa, P. Cloutier, D. Hunting, M. A. Huels, and L. Sanche, Science 287, 1658 (2000). 10.1126/science.287.5458.1658
20. S. Fabiano, H. Yoshida, Z. H. Chen, A. Facchetti, and M. A. Loi, ACS Appl. Mater. Interfaces 5, 4417 (2013). 10.1021/am400786c
21. W. Han, H. Yoshida, N. Ueno, and S. Kera, Appl. Phys. Lett. 103, 123303 (2013). 10.1063/1.4821445
22. The error function is integral of the Gaussian function. Hence, the fitting the error function to the original spectrum is mathematically equivalent to fitting the Gaussian function to the first derivative of the spectrum.
23. H. Yoshida, K. Tsutsumi, and N. Sato, J. Electron Spectrosc. Relat. Phenom. 121, 83 (2001). 10.1016/S0368-2048(01)00328-0
24. W. Y. Gao and A. Kahn, Org. Electron. 3, 53 (2002). 10.1016/S1566- 1199(02)00033-2