Near-ultraviolet inverse photoemission spectroscopy using ultra-low energy electrons

Chemical Physics Letters

Volumn 539-540, Issue , 2012, Pages 180-185

  Yoshida, Hiroyuki ^a,b  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER PHTHALOCYANINE FILMS; ENERGY RESOLUTIONS; INVERSE PHOTOEMISSION SPECTROSCOPY; ORGANIC SAMPLES; ORGANIC SEMICONDUCTING MATERIALS; SOLID MATERIAL; ULTRA LOW ENERGY; VACUUM ULTRAVIOLETS;

VACUUM APPLICATIONS;

HETEROJUNCTIONS;

EID: 84862689105     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2012.04.058     Document Type: Article

References (40)

1. P.D. Johnson, and S.L. Hulbert Rev. Sci. Instrum. 61 1990 2277
2. J.C. Fuggle, and J.E. Inglesfield Top. Appl. Phys. 69 1992 1
3. J.B. Pendry Phys. Rev. Lett. 45 1980 1356
4. J.B. Pendry J. Phys. C 14 1981 1381
5. P.D. Johnson, and J.W. Davenport Phy. Rev. B 31 1985 7521
6. P. Ohlin Ark. Mat. Astron. Fys. 29A 1942 3
7. B.R.A. Nijboer Physica 12 1946 461
8. J.K. Lang, and Y. Baer Rev. Sci. Instrum. 50 1979 221
9. V. Dose Appl. Phys. 14 1977 117
10. V. Dose, T. Fauster, and R. Schneider Appl. Phys. A-Mater. Sci. Process. 40 1986 203
11. R. Stiepel, R. Ostendorf, C. Benesch, and H. Zacharias Rev. Sci. Instrum. 76 2005 063109
12. M. Maniraj, S.W. D'Souza, J. Nayak, A. Rai, S. Singh, B.N.R. Sekhar, and S.R. Barman Rev. Sci. Instrum. 82 2011 093901
13. D. Funnemann, and H. Merz J. Phys. E 19 1986 554
14. J.A. Lipton-Duffin, A.G. Mark, and A.B. McLean Rev. Sci. Instrum. 73 2002 3149
15. N. Babbe, W. Drube, I. Schafer, and M. Skibowski J. Phys. E 18 1985 158
16. K. Yokoyama, K. Nishihara, K. Mimura, Y. Hari, M. Taniguchi, Y. Ueda, and M. Fujisawa Rev. Sci. Instrum. 64 1993 87
17. F. Schedin, G. Thornton, and R.I.G. Uhrberg Rev. Sci. Instrum. 68 1997 41
18. G. Chauvet, and R. Baptist J. Electron Spectrosc. Relat. Phenom. 24 1981 255
19. T. Fauster, F.J. Himpsel, J.J. Donelon, and A. Marx Rev. Sci. Instrum. 54 1983 68
20. T. Fauster, D. Straub, J.J. Donelon, D. Grimm, A. Marx, and F.J. Himpsel Rev. Sci. Instrum. 56 1985 1212
21. J.H. Moore, C.C. Davis, M.A. Coplan, S.C. Greer, Building Scientific Apparatus, fourth ed., Cambridge University Press, New York, 2009 (Chap. 4.3.8 and Table 4.9).
22. L. Martinu, and D. Poitras J. Vac. Sci. Technol., A 18 2000 2619
23. A. Kahn, N. Koch, and W.Y. Gao J. Polym. Sci. B 41 2003 2529
24. P.I. Djurovich, E.I. Mayo, S.R. Forrest, and M.E. Thompson Org. Electron. 10 2009 515
25. B. Boudaiffa, P. Cloutier, D. Hunting, M.A. Huels, and L. Sanche Science 287 2000 1658
26. P.W. Erdman, and E.C. Zipf Rev. Sci. Instrum. 53 1982 225
27. http://jp.hamamatsu.com/resources/products/etd/pdf/R464-R585-TPMH1140E03. pdf.
28. M.L.M. Rocco, K.H. Frank, P. Yannoulis, and E.E. Koch J. Chem. Phys. 93 1990 6859
29. I.G. Hill, A. Kahn, Z.G. Soos, and R.A. Pascal Chem. Phys. Lett. 327 2000 181
30. H. Yoshida, K. Tsutsumi, N. Sato, and J. Electron Spectrosc Relat. Phenom. 121 2001 83
31. R. Murdey, N. Sato, and M. Bouvet Mol. Cryst. Liquid Cryst. 455 2006 211
32. D.R.T. Zahn, G.N. Gavrila, and M. Gorgoi Chem. Phys. 325 2006 99
33. H.J. Ding, and Y.L. Gao Appl. Phys. Lett. 92 2008 053309
34. S. Krause, M.B. Casu, A. Schöll, and E. Umbach New J. Phys. 10 2008 085001
35. J. Xiao, and P.A. Dowben J. Mater. Chem. 19 2009 2172
36. K. Akaike, A. Opitz, J. Wagner, W. Brutting, K. Kanai, Y. Ouchi, and K. Seki Org. Electron. 11 2010 1853
37. C.I. Wu, Y. Hirose, H. Sirringhaus, and A. Kahn Chem. Phys. Lett. 272 1997 43
38. N. Sato, H. Yoshida, K. Tsutsumi, and J. Electron Spectrosc Relat. Phenom. 88 1998 861
39. T. Nishi, T. Iwahashi, H. Yamane, Y. Ouchi, K. Kanai, and K. Seki Chem. Phys. Lett. 455 2008 213
40. L. Reimer, in: P.W. Hawkes (Ed.), Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, Springer Series in Optical Sciences, Vol. 36, Springer, Berlin, 1997 (Chapter 11).