Inverse photoemission with energy resolution better than 200 meV

Review of Scientific Instruments

Volumn 78, Issue 8, 2007, Pages

  Budke, M ^a   Renken, V ^a   Liebl, H ^b,c   Rangelov, G ^a   Donath, M ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

^c NONE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EXCITATION; ELECTRON BEAMS; FERMI LEVEL; GOLD; PHOTOEMISSION; PHOTONS; POLYCRYSTALLINE MATERIALS; VACUUM APPLICATIONS;

ELECTROSTATIC DEFLECTORS; OPTICAL BANDPASSES; ULTRAVIOLET RANGE; VARIABLE ENERGY RESOLUTION;

SPECTROMETERS;

ARTICLE; COMPUTER AIDED DESIGN; ENERGY TRANSFER; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; PHOTON; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; ULTRAVIOLET SPECTROPHOTOMETRY;

COMPUTER-AIDED DESIGN; ENERGY TRANSFER; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; PHOTONS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTROPHOTOMETRY, ULTRAVIOLET;

EID: 34548404321     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2771096     Document Type: Article

References (36)

1. Angle-Resolved Photoemission, edited by, S. D. Kevan, (Elsevier, Amsterdam, 1992).
2. P. D. Johnson, Rep. Prog. Phys. 60, 1217 (1997).
3. S. Hüfner, Photoelectron Spectroscopy, Principles and Applications (Springer, New York, 2003).
4. V. Dose, Surf. Sci. Rep. 5, 337 (1985).
5. N. V. Smith, Rep. Prog. Phys. 51, 1227 (1988).
6. M. Donath, Surf. Sci. Rep. 20, 251 (1994).
7. J. B. Pendry, Phys. Rev. Lett. 45, 1356 (1980).
8. R. D. Young, Phys. Rev. 113, 110 (1959).
9. D. T. Pierce and F. Meier, Phys. Rev. B 13, 5484 (1976).
10. U. Kolac, M. Donath, K. Ertl, H. Liebl, and V. Dose, Rev. Sci. Instrum. 59, 1933 (1988).
11. M. Cantoni and R. Bertacco, Rev. Sci. Instrum. 75, 2387 (2004).
12. V. Dose, Appl. Phys. 14, 117 (1977).
13. A. Goldmann, M. Donath, W. Altmann, and V. Dose, Phys. Rev. B 32, 837 (1985).
14. V. Dose, Th. Fauster, and R. Schneider, Appl. Phys. A: Solids Surf. 40, 203 (1986).
15. J. Braun, C. Math, A. Postnikov, and M. Donath, Phys. Rev. B 65, 184412 (2002).
16. W. R. Hunter and S. A. Malo, Phys. Chem. Solids 30, 2739 (1969).
17. M. H. Reilly, J. Phys. Chem. Solids 31, 1041 (1970).
18. V. Dose, Rev. Sci. Instrum. 37, 1055 (1968).
19. D. Funnemann and H. Merz, J. Phys. E 19, 554 (1986).
20. P. M. G. Allen and P. J. Dobson, Solid State Commun. 55, 701 (1987).
21. J. A. Lipton-Duffin, A. G. Mark, and A. B. McLean, Rev. Sci. Instrum. 73, 3149 (2002).
22. R. Stiepel, R. Ostendorf, C. Benesch, and H. Zacharias, Rev. Sci. Instrum. 76, 063109 (2005).
23. M. Nakatake, Y. Okamura, S. Akiyama, H. Namatame, and M. Taniguchi, J. Electron Spectrosc. Relat. Phenom. 88-91, 1027 (1998).
24. F. J. Himpsel, Surf. Sci. Rep. 12, 1 (1990).
25. H. Liebl, Optik (Stuttgart) 53, 69 (1979).
26. H. Liebl, Nucl. Instrum. Methods Phys. Res. A 292, 537 (1990).
27. J. T. Yates, Jr., Experimental Innovations in Surface Science (Springer, New York, 1998), p. 288.
28. J. T. Yates, Jr., Experimental Innovations in Surface Science (Springer, New York, 1998), p. 304.
29. J. A. R. Samson, Techniques of Vacuum Ultraviolet Spectroscopy (Wiley, New York, 1969).
30. W. Trott, C. Blais, and E. Walters, J. Chem. Phys. 69, 3150 (1978).
31. V. H. Dibeler, J. A. Walker, K. E. McCullooh, and H. M. Rosenstock, Int. J. Mass Spectrom. Ion Phys. 7, 209 (1971).
32. V. Dose, W. Altmann, A. Goldmann, U. Kolac, and J. Rogozik, Phys. Rev. Lett. 52, 1919 (1984).
33. D. Straub and F. J. Himpsel, Phys. Rev. Lett. 52, 1922 (1984).
34. U. Höfer, I. L. Shumay, Ch. Reuß, U. Thomann, W. Wallauer, and Th. Fauster, Science 277, 1480 (1997).
35. Th. Fauster and W. Steinmann in Electromagnetic Waves: Recent Developments in Research Photonic Probes of Surfaces, edited by, P. Halevi, (Elsevier, Amsterdam, 1995), Vol. 2, p. 347.
36. F. Passek and M. Donath, Phys. Rev. Lett. 69, 1101 (1992).