Direct observation of the thickness distribution of ultra thin AlOx barriers in Al/AlOx/Al Josephson junctions

Journal of Physics D: Applied Physics

Volumn 48, Issue 39, 2015, Pages

  Zeng, L J ^a   Nik, S ^a   Greibe, T ^a   Krantz, P ^a   Wilson, C M ^a   Delsing, P ^a   Olsson, E ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

aluminium oxide barrier; barrier thickness distribution; junction conductance; tunnel junction

Indexed keywords

ALUMINUM; ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; THICKNESS CONTROL; TRANSMISSION ELECTRON MICROSCOPY;

ALUMINIUM OXIDE; ATOMIC RESOLUTION; BARRIER THICKNESS; DIRECT OBSERVATIONS; RESISTANCE MEASUREMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STATE OF THE ART; THICKNESS DISTRIBUTIONS;

TUNNEL JUNCTIONS;

EID: 84942026153     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/48/39/395308     Document Type: Article

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