Characterization of aluminum oxide tunnel barriers by combining transport measurements and transmission electron microscopy imaging

Journal of Applied Physics

Volumn 116, Issue 7, 2014, Pages

  Aref, T ^a,d   Averin, A ^a   Van Dijken, S ^a   Ferring, A ^b   Koberidze, M ^a   Maisi, V F ^a,c,e   Nguyend, H Q ^a,f   Nieminen, R M ^a   Pekola, J P ^a   Yao, L D ^a  

^a AALTO UNIVERSITY   (Finland)

^b UNIVERSITY OF HEIDELBERG   (Germany)

^c CENTRE FOR METROLOGY AND ACCREDITATION MIKES   (Finland)

^d CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^e ETH ZURICH   (Switzerland)

^f VIETNAM NATIONAL UNIVERSITY   (Viet Nam)

Author keywords

[No Author keywords available]

Indexed keywords

PHYSICAL PROPERTIES; PHYSICS;

ALUMINUM-OXIDE TUNNEL BARRIERS; BARRIER THICKNESS; CONDUCTION CHANNEL; SINGLE ELECTRON; THEORETICAL CALCULATIONS; TRANSPORT MEASUREMENTS; TUNNELING PROCESS; TWO-ELECTRON TUNNELING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 84906568761     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4893473     Document Type: Article

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