Properties of native ultrathin aluminium oxide tunnel barriers

Journal of Physics Condensed Matter

Volumn 15, Issue 10, 2003, Pages 1733-1746

  Gloos, K ^a,b   Koppinen, P J ^a   Pekola, J P ^a,c  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

^c AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRON TUNNELING; MIM DEVICES; OXYGEN;

GATE DIELECTRICS;

TUNNEL JUNCTIONS;

EID: 0037454191     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/10/320     Document Type: Article

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