Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110)

Journal of Chemical Physics

Volumn 143, Issue 9, 2015, Pages

  Jöhr, Res ^a   Hinaut, Antoine ^a   Pawlak, Rémy ^a   Sadeghi, Ali ^b   Saha, Santanu ^a   Goedecker, Stefan ^a   Such, Bartosz ^c   Szymonski, Marek ^c   Meyer, Ernst ^a   Glatzel, Thilo ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b SHAHID BEHESHTI UNIVERSITY   (Iran)

^c JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; CALCULATIONS; CHARACTERIZATION; ELECTRONIC PROPERTIES; HYBRID MATERIALS; MOLECULES; OXIDE MINERALS; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY;

ADSORPTION GEOMETRIES; COMPLEMENTARY METHODS; CONTACT POTENTIAL DIFFERENCE; EXPERIMENTAL CHARACTERIZATION; FIRST-PRINCIPLES CALCULATION; FUNCTIONALIZED MATERIALS; KELVIN PROBE FORCE MICROSCOPY; TETRA (4 CARBOXYPHENYL)PORPHYRIN;

ADSORBATES;

EID: 84941098417     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4929608     Document Type: Article

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