24h stability of thick multilayer silicene in air

2D Materials

Volumn 1, Issue 2, 2014, Pages

  De Padova, Paola ^a   Ottaviani, Carlo ^a   Quaresima, Claudio ^a   Olivieri, Bruno ^a   Imperatori, Patrizia ^a   Salomon, Eric ^b   Angot, Thierry ^b   Quagliano, Lucia ^a,c   Romano, Claudia ^c   Vona, Alessandro ^c   Muniz Miranda, Maurizio ^d   Generosi, Amanda ^a   Paci, Barbara ^a   Lay, Guy Le ^a,b  

^a CNR   (Italy)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c ROMA TRE UNIVERSITY   (Italy)

^d UNIVERSITY OF FLORENCE   (Italy)

Author keywords

AES; EDXR; LEED; Raman spectroscopy; STM; Thick multilayer silicene; XRD

Indexed keywords

ALUMINA; ALUMINUM OXIDE; AUGER ELECTRON SPECTROSCOPY; ENVIRONMENTAL DESIGN; MULTILAYERS; RAMAN SPECTROSCOPY; SILICENE;

EDXR; RAMAN SPECTROSCOPY MEASUREMENTS; RAMAN STRUCTURE; SURFACE OXIDATIONS; THICK EPITAXIAL; THICK MULTILAYERS;

MULTILAYER FILMS;

EID: 84940199692     PISSN: None     EISSN: 20531583     Source Type: Journal    
DOI: 10.1088/2053-1583/1/2/021003     Document Type: Article

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