Structural evolution of single-layer films during deposition of silicon on silver: A first-principles study

Journal of Physics Condensed Matter

Volumn 24, Issue 44, 2012, Pages

  Kaltsas, D ^a   Tsetseris, L ^a   Dimoulas, A ^b  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^b INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

AG SUBSTRATE; AG(111) SURFACE; ATOMIC-SCALE MECHANISMS; EXCESS SI; EXPERIMENTAL STUDIES; FIRST-PRINCIPLES CALCULATION; FIRST-PRINCIPLES STUDY; HONEYCOMB NETWORKS; OVERLAYERS; SI FILMS; SINGLE LAYER FILMS; STRUCTURAL EVOLUTION; ULTRA-THIN; WETTING LAYER;

CALCULATIONS; ELECTRIC NETWORK TOPOLOGY; GRAPHENE; SILICON;

SILVER;

EID: 84867531556     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/44/442001     Document Type: Article

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