Growth and structural properties of silicene at multilayer coverage

Journal of Physics Condensed Matter

Volumn 26, Issue 18, 2014, Pages

  Salomon, E ^a   El Ajjouri, R ^a   Lay, G Le ^a   Angot, T ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

growth; multilayer; scanning tunneling microscopy; silicene

Indexed keywords

ELECTRONS; GROWTH (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; MULTILAYER FILMS; SCANNING TUNNELING MICROSCOPY; STRUCTURAL PROPERTIES;

AG(1 1 1); DIFFERENT DOMAINS; GROWTH CONDITIONS; MONOLAYER COVERAGE; SILICENE; STRUCTURAL ARRANGEMENT; STRUCTURAL ASPECTS; STRUCTURAL PHASIS;

MULTILAYERS;

GRAPHITE; SILICON; SILVER;

CHEMISTRY; DIFFUSION; ELECTRON; SURFACE PROPERTY;

DIFFUSION; ELECTRONS; GRAPHITE; SILICON; SILVER; SURFACE PROPERTIES;

EID: 84899416765     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/26/18/185003     Document Type: Article

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