Identification of critical load for scratch adhesion strength of nitride-based thin films using wavelet analysis and a proposed analytical model

Surface and Coatings Technology

Volumn 277, Issue , 2015, Pages 216-221

  Hassan, M A ^a,b   Bushroa, A R ^a   Mahmoodian, Reza ^a,c  

^a UNIVERSITY OF MALAYA   (Malaysia)

^b Assiut University   (Egypt)

^c Azarin Kar Ind Co   (Iran)

Author keywords

Analytical models; Critical load; Micro scratch test; Nitride based coatings; Wavelet analysis

Indexed keywords

ACOUSTIC EMISSION TESTING; ADHESION; ANALYTICAL MODELS; BOND STRENGTH (MATERIALS); COATINGS; HIGH SPEED STEEL; NITRIDES; SILICON ALLOYS; SILICON STEEL; STEEL METALLOGRAPHY; STEEL TESTING; TITANIUM ALLOYS; WAVELET ANALYSIS;

ACOUSTIC EMISSION SIGNAL; CRITICAL LOAD; FORCE-DISPLACEMENT CURVES; FORCE-DISPLACEMENT DATA; MANUFACTURING PROCESS; MICRO-SCRATCH TEST; THIN FILM SUBSTRATE; WAVELET TECHNIQUES;

THIN FILMS;

EID: 84939839663     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2015.07.061     Document Type: Article

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