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Volumn 85, Issue 8, 2014, Pages

An experimental setup for the simultaneous measurement of thermoelectric power of two samples from 77 K to 500 K

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS INDUSTRY; RESISTORS; SURFACE MOUNT TECHNOLOGY; THERMOCOUPLES;

EID: 84938707296     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4891631     Document Type: Article
Times cited : (48)

References (35)
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    • Chu, S.1    Majumdar, A.2
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    • 0842331452 scopus 로고    scopus 로고
    • Profiling the Thermoelectric Power of Semiconductor Junctions with Nanometer Resolution
    • DOI 10.1126/science.1091600
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    • See for all the standard data, e.g., absolute thermoelectric power, thermoelectric power vs temperature data, etc., related to thermocouples
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  • 33


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.