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Volumn 82, Issue 1, 2011, Pages

An apparatus for simultaneous measurement of electrical conductivity and thermopower of thin films in the temperature range of 300-750 K

(7) Ravichandran, J a,b Kardel, J T c Scullin, M L c Bahk, J H d Heijmerikx, H a Bowers, J E d Majumdar, A b,c,e,f

a UNIVERSITY OF CALIFORNIA (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c University of California Berkeley (United States)

d University of California (United States)

e UNIVERSITY OF CALIFORNIA (United States)

f Currently with Benson Hill (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION PROCEDURE; DC RESISTANCE; DIFFERENTIAL METHODS; ELECTRICAL CONDUCTIVITY; HIGH TEMPERATURE; MEASUREMENT PROCEDURES; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; NEW INSTRUMENT; SIMULTANEOUS MEASUREMENT; TEMPERATURE RANGE; THERMOPOWERS; VANDER PAUW GEOMETRY;

CALIBRATION; ELECTRIC CONDUCTIVITY; STANDARDS; THERMOELECTRIC POWER; THIN FILMS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 79551672441 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3529438 Document Type: Article

Times cited : (19)

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