High temperature Seebeck coefficient metrology

Journal of Applied Physics

Volumn 108, Issue 12, 2010, Pages

  Martin, J ^a   Tritt, T ^b   Uher, C ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b CLEMSON UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPARATUS DESIGN; BULK MATERIALS; HIGH TEMPERATURE; INTERLABORATORY COMPARISON; MEASUREMENT TECHNIQUES; NONIDEAL; PROPERTY MEASUREMENT; THERMAL AND ELECTRICAL CONDUCTIVITY; THERMOELECTRIC MATERIAL; THERMOELECTRIC MEASUREMENTS;

ELECTRIC CONDUCTIVITY; SEEBECK COEFFICIENT;

UNCERTAINTY ANALYSIS;

EID: 78650886649     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3503505     Document Type: Review

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