SCOPUS 정보 검색 플랫폼

Journal of Electronic Materials

Volumn 38, Issue 7, 2009, Pages 1109-1115

Microchip for the measurement of seebeck coefficients of single nanowires

(6) Volklein F a Schmitt, M a Cornelius, T W b Picht, O b Muller S b Neumann, R b

a RHEINMAIN UNIVERSITY OF APPLIED SCIENCES (Germany)

b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH (Germany)

Author keywords

Bismuth; Microchip; Nanowire; Seebeck coefficient

Indexed keywords

BISMUTH NANOWIRES; CONTACT PADS; ION TRACK; LIFT-OFF PROCESS; LOW THERMAL CONDUCTIVITY; MICRO-LITHOGRAPHY; MICROCHIP; POLYCARBONATE MEMBRANES; REFERENCE FILMS; SEEBECK COEFFICIENT MEASUREMENT; SEEBECK VOLTAGE; SI WAFER; SINGLE NANOWIRES; TEMPERATURE DIFFERENCES; THIN METALS;

BISMUTH; ELECTRIC POTENTIAL; ELECTRIC WIRE; MICROPROCESSOR CHIPS; SEEBECK COEFFICIENT; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

NANOWIRES;

EID: 67650505656 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-009-0714-6 Document Type: Conference Paper

Times cited : (23)

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