Rapid Estimation of the Probability of SRAM Failure due to MOS Threshold Variations

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007

Volumn , Issue , 2007, Pages 229-232

  Srivastava, Shweta ^a   Roychowdhury, Jaijeet ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS; MIXED SIGNAL INTEGRATED CIRCUITS; SPICE; STATIC RANDOM ACCESS STORAGE; THRESHOLD VOLTAGE;

ACCURATE ESTIMATION; DEEP SUB-MICRON TECHNOLOGY; MONTE CARLO TECHNIQUES; PARAMETER SPACES; RAPID ESTIMATION; STATIC NOISE MARGIN; TRACING TECHNIQUE; YIELD ESTIMATION;

MONTE CARLO METHODS;

EID: 84938596928     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2007.4405720     Document Type: Conference Paper

References (12)

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